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Volumn 54, Issue , 1997, Pages 101-108

Structural and thermal properties of high porosity freeze-dried porous silicon

Author keywords

Freeze Drying; Porous Silicon; Sensor; Thermal Conductivity; Thermal Insulator

Indexed keywords

LOW TEMPERATURE DRYING; NONDESTRUCTIVE EXAMINATION; SILICON ON INSULATOR TECHNOLOGY; SURFACE STRUCTURE; THERMAL CONDUCTIVITY OF SOLIDS; THERMAL INSULATING MATERIALS;

EID: 0031387002     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/ssp.54.101     Document Type: Article
Times cited : (1)

References (27)
  • 4
    • 0015771980 scopus 로고
    • 2O-Isopropyl Alcohol
    • Semiconductor Silicon, H. R. Huff and R. R. Burgess, Princeton (ed. ), NJ
    • 2O-Isopropyl Alcohol", in Semiconductor Silicon, H. R. Huff and R. R. Burgess, Princeton (ed. ), NJ, Electrochemical Society Proceedings, 1973, p. 339
    • (1973) Electrochemical Society Proceedings , pp. 339
    • Price, J.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.