Resistance of molecular nanostructures

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 1, Issue 1-4, 1997, Pages 304-309

  Tian, Weidong ^a   Datta, Supriyo ^a   Hong, Seunghun ^a   Reifenberger, R G ^a   Henderson, J I ^a   Kubiak, C P ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

Current voltage spectroscopy; Scanning tunneling microscopy (STM); Self assembled monolayers (SAMs)

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC RESISTANCE; FERMI LEVEL; MATHEMATICAL MODELS; MONOLAYERS; NANOSTRUCTURED MATERIALS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING FILMS; SEMICONDUCTING POLYMERS;

MOLECULAR NANOSTRUCTURES; MOLECULAR WIRES; SELF ASSEMBLED MONOLAYERS (SAM); XYLYL DITHIOL;

SEMICONDUCTOR QUANTUM WIRES;

EID: 0031380603     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/s1386-9477(97)00065-9     Document Type: Article

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