A 75-110 GHz automated tuner with exceptional range and repeatability

IEEE Microwave and Guided Wave Letters

Volumn 6, Issue 10, 1996, Pages 378-379

  Drury, Robert ^a,b   Pollard, Roger D ^a,b   Snowden, Christopher M ^a,b  

^a UNIVERSITY OF LEEDS   (United Kingdom)

^b IEEE

Author keywords

[No Author keywords available]

Indexed keywords

ACTUATORS; AUTOMATION; CAVITY RESONATORS; ELECTROMAGNETIC WAVE REFLECTION; LINEAR MOTORS; MATHEMATICAL MODELS; SIGNAL NOISE MEASUREMENT; WAVEGUIDES;

AUTOMATED TUNER; ON WAFER NOISE MEASUREMENT; REFLECTION COEFFICIENTS; REPEATABILITY;

TUNERS;

EID: 0030270167     PISSN: 10518207     EISSN: None     Source Type: Journal    
DOI: 10.1109/75.536951     Document Type: Article

References (2)

1. R. Meierer and C. Tsironis, "An on-wafer noise parameter measurement technique with automatic receiver calibration," Microwave J., vol. 38, no. 3, p. 22, Mar. 1995.
2. A. E. Bailey, Ed. Microwave Measurement. London, U.K.: Peter Peregrinus, p. 77.