W-band noise figure measurement designed for on-wafer characterization

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 1996, Pages 1273-1276

  Drury, Robert ^a   Pollard, Roger D ^a   Snowden, Christopher M ^a  

^a UNIVERSITY OF LEEDS   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK PARAMETERS; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; SIGNAL NOISE MEASUREMENT; SPURIOUS SIGNAL NOISE; WAVEGUIDES;

RECEIVER REFERENCE PLANE; S PARAMETER MEASUREMENT; W BAND ON WAFER CHARACTERIZATION;

MONOLITHIC MICROWAVE INTEGRATED CIRCUITS;

EID: 0029725214     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)