Surface plasmon scanning near-field optical microscopy

Journal of Applied Physics

Volumn 82, Issue 11, 1997, Pages 5411-5415

  Kryukov, A E ^a   Kim, Y K ^a   Ketterson, J B ^a,b  

^a NORTHWESTERN UNIVERSITY   (United States)

^b Dept of Elec and Comp Engineering ^*

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROMAGNETIC FIELDS; ELECTROMAGNETIC WAVE SCATTERING; LASERS; MICROSCOPES; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE;

CONICAL RADIATION; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SURFACE PLASMONS;

OPTICAL MICROSCOPY;

EID: 0031374009     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365568     Document Type: Article

References (10)

1. G. Binning, H. Rohrer, Ch. Gerber, and E. Weibel, Phys. Rev. Lett. 49, 57 (1982).
2. D. Raether, Surface Plasmons on Smooth and Rough Surfaces and on Gratings (Springer-Verlag, Berlin, 1988).
3. H. J. Simon and J. K. Guha, Opt. Commun. 18, 391 (1976).
4. M. Specht, J. D. Pedaring, W. H. Heckl, and T. W. Hänsch, Phys. Rev. Lett. 68, 476 (1992).
5. R. B. G. de Hollander, N. F. van Hulst, and R. P. H. Kooyman, Ultramicroscopy 57, 263 (1995).
6. Y.-K. Kim, P. M. Lundquist, J. A. Helfrich, J. M. Micrut, G. K. Wong, P. R. Auvil, and J. B. Ketterson, Appl. Phys. Lett. 66, 3407 (1995).
7. Y.-K. Kim, P. R. Auvil, and J. B. Ketterson, Appl. Opt. 36, 841 (1997).
8. Y.-K. Kim, J. B. Ketterson, and D. J. Morgan, Opt. Lett. 21, 165 (1996).
9. W. H. Weber and C. F. Eagen, Opt. Lett. 4, 236 (1979).
10. S. Byahut and T. E. Furtak, Rev. Sci. Instrum. 61, 27 (1990).