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Volumn 21, Issue 3, 1996, Pages 165-167
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Scanning plasmon optical microscope operation in atomic force microscope mode
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0005251655
PISSN: 01469592
EISSN: None
Source Type: Journal
DOI: 10.1364/OL.21.000165 Document Type: Article |
Times cited : (20)
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References (14)
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