Hydrogen redistribution in thin silicon dioxide films under electron injection in high fields

Journal of Applied Physics

Volumn 82, Issue 11, 1997, Pages 5573-5579

  Gadiyak, G V ^a  

^a INSTITUTE OF COMPUTATIONAL TECHNOLOGIES   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; COMPUTER SIMULATION; DEFECTS; DIFFUSION; ELECTRON TRANSPORT PROPERTIES; HYDROGEN; MATHEMATICAL MODELS; MODELS; NUMERICAL METHODS; PHOTOEMISSION; REACTION KINETICS; SILICA;

ELECTRICAL STRESS; ELECTRON INJECTION; HYDROGEN REDISTRIBUTION;

THIN FILMS;

EID: 0031367910     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366417     Document Type: Article

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