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Volumn 222, Issue , 1997, Pages 183-192

Opportunities and needs for interfacial fracture mechanics in microelectronic packaging industry

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS INDUSTRY; ELECTRONICS PACKAGING; INTERFACES (MATERIALS); RELIABILITY; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR MATERIALS;

EID: 0031356983     PISSN: 01608835     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article
Times cited : (6)

References (20)
  • 4
    • 0542366864 scopus 로고
    • Characterization of Interfacial Fracture Toughness of Bimaterial Interfaces as a Function of Mode Mixity
    • Phila. PA October
    • Goodelle, J., Pearson, R., Wu, T., "Characterization of Interfacial Fracture Toughness of Bimaterial Interfaces as a Function of Mode Mixity", 25th Int. SAMPLE Tech Conf. Phila. PA October 1993. p. 951.
    • (1993) 25th Int. SAMPLE Tech Conf. , pp. 951
    • Goodelle, J.1    Pearson, R.2    Wu, T.3
  • 9
    • 0042873320 scopus 로고    scopus 로고
    • Institute for Printed Circuits, 1995,A 1997 IPC Roadmap revision is expected to be published in
    • Institute for Printed Circuits (IPC), "National Technology Roadmap for Electronic Interconnections", Institute for Printed Circuits, 1995,A 1997 IPC Roadmap revision is expected to be published in 1997.
    • (1997) National Technology Roadmap for Electronic Interconnections
  • 12
    • 0000793139 scopus 로고
    • Cramming More Components onto Integrated Circuits
    • April 19
    • Moore G., "Cramming More Components onto Integrated Circuits" Electronics Magazine Vol.. 38, No. 8, April 19, 1965, pp 114-117. An excellent description of on Moore's Law may be found in the paper by Robert R. Schaller in IEEE Spectrum June 1997, pp 53-59.
    • (1965) Electronics Magazine , vol.38 , Issue.8 , pp. 114-117
    • Moore, G.1
  • 13
    • 0343991396 scopus 로고    scopus 로고
    • June
    • Moore G., "Cramming More Components onto Integrated Circuits" Electronics Magazine Vol.. 38, No. 8, April 19, 1965, pp 114-117. An excellent description of on Moore's Law may be found in the paper by Robert R. Schaller in IEEE Spectrum June 1997, pp 53-59.
    • (1997) IEEE Spectrum , pp. 53-59
    • Schaller, R.R.1
  • 14
    • 0041354799 scopus 로고    scopus 로고
    • National Electronics Manufacturing Initiatives, Inc. December
    • National Electronics Manufacturing Initiatives (NEMI). "National Electronics Manufacturing Technology Roadmaps" National Electronics Manufacturing Initiatives, Inc. December 1996.
    • (1996) National Electronics Manufacturing Technology Roadmaps
  • 15
    • 0013386098 scopus 로고    scopus 로고
    • Wafer Bumping Technologies - A comparative Analysis of Solder Deposition Processes and Assembly Considerations
    • (Interpack 1997) 6/25-6/29
    • Patterson, D., Elenius, P., Leal, J., "Wafer Bumping Technologies - A comparative Analysis of Solder Deposition Processes and Assembly Considerations", 1997 International Intersociaty Electronic & Photonic Packaging Conference (Interpack 1997) 6/25-6/29 1997, pp 337-3517.
    • (1997) 1997 International Intersociaty Electronic & Photonic Packaging Conference , pp. 337-3517
    • Patterson, D.1    Elenius, P.2    Leal, J.3
  • 16
    • 0003552056 scopus 로고    scopus 로고
    • Semiconductor Industry Association; the Roadmap is in the process of revision. A 1997 SIA Roadmap is expected to be published in November
    • Semiconductor Industry Association (SIA), "National Technology Roadmap for Semiconductors 1994", Semiconductor Industry Association; the Roadmap is in the process of revision. A 1997 SIA Roadmap is expected to be published in November 1997.
    • (1997) National Technology Roadmap for Semiconductors 1994
  • 18
    • 4243617178 scopus 로고    scopus 로고
    • Chip to Package Interconnections
    • Chapter 8 ed. Rao R. Tummala, Eugene J. Rymaszewski, Alan G. Klopfenstein, 2nd edition Chapman & Hall
    • Totta, P., Khadpe, S., Koopman, N., Reily, T., Sheaffer, M., "Chip to Package Interconnections" Chapter 8 of the "Microelectronics Packaging Handbook Pan II" ed. Rao R. Tummala, Eugene J. Rymaszewski, Alan G. Klopfenstein, 2nd edition Chapman & Hall, 1997.
    • (1997) Microelectronics Packaging Handbook Pan II
    • Totta, P.1    Khadpe, S.2    Koopman, N.3    Reily, T.4    Sheaffer, M.5
  • 20
    • 36448998765 scopus 로고
    • Interface Fracture and Viscoelastic Deformation in Finite Size Specimens
    • Xu, D., Hui, C., Kramer, E., "Interface Fracture and Viscoelastic Deformation in Finite Size Specimens", J. Applied Physics, 72(8), 1992, pp 3305.
    • (1992) J. Applied Physics , vol.72 , Issue.8 , pp. 3305
    • Xu, D.1    Hui, C.2    Kramer, E.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.