Morphological change in the degradation of Al electrode surfaces of electroluminescent devices by fluorescence microscopy and AFM

Thin Solid Films

Volumn 273, Issue 1-2, 1996, Pages 209-213

  Do, Lee M ^a   Oyamada, Mitsuaki ^a   Koike, Amane ^a   Han, Eun M ^a   Yamamoto, Noritaka ^a   Fujihira, Masamichi ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Aluminium; Atomic force microscopy; Luminescence; Surface morphology

Indexed keywords

ALUMINUM; ATOMIC FORCE MICROSCOPY; DEGRADATION; ELECTRODES; MICROSCOPIC EXAMINATION; MORPHOLOGY; ORGANIC COMPOUNDS; SURFACE ROUGHNESS; SURFACES;

CREVASSE; DOME FORMATION; FLUORESCENCE MICROSCOPY; MORPHOLOGICAL CHANGES; ORGANIC ELECTROLUMINESCENT DEVICES;

LUMINESCENT DEVICES;

EID: 0030079194     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)06781-7     Document Type: Article

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