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Volumn 73, Issue , 1997, Pages 368-370
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Extraction of trapped ions from the Tokyo Electron Beam Ion Trap
c
HITACHI LTD
(Japan)
e
KOBE UNIVERSITY
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC PHYSICS;
COMPUTER SIMULATION;
ELECTRON BEAMS;
ION BEAMS;
ION BOMBARDMENT;
ION SOURCES;
ELECTRON BEAM ION TRAPS (EBIT);
PARTICLE BEAM EXTRACTION;
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EID: 0030647093
PISSN: 02811847
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1088/0031-8949/1997/t73/121 Document Type: Article |
Times cited : (5)
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References (11)
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