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Volumn 73, Issue , 1997, Pages 368-370

Extraction of trapped ions from the Tokyo Electron Beam Ion Trap

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; COMPUTER SIMULATION; ELECTRON BEAMS; ION BEAMS; ION BOMBARDMENT; ION SOURCES;

EID: 0030647093     PISSN: 02811847     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1088/0031-8949/1997/t73/121     Document Type: Article
Times cited : (5)

References (11)
  • 8
    • 5844349788 scopus 로고    scopus 로고
    • Idaho National Engineering Laboratory and Princeton Electronic Systems, Inc.
    • Idaho National Engineering Laboratory and Princeton Electronic Systems, Inc.
  • 11


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.