Complementary analysis of ALE-grown SrS based thin film electroluminescent structures with ion beam methods

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 132, Issue 4, 1997, Pages 685-696

  Lappalainen, R ^a   Jokinen, J ^a   Li, W M ^a   Ritala, M ^a   Leskela M ^a   Soininen, E ^b  

^a UNIVERSITY OF HELSINKI   (Finland)

^b Planar Systems Inc Finland   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; ELECTROLUMINESCENCE; ION BEAMS; NONDESTRUCTIVE EXAMINATION; STRONTIUM COMPOUNDS; SULFUR COMPOUNDS;

ELASTIC RECOIL DETECTION; NUCLEAR RESONANCE BROADENING;

PHOSPHORS;

EID: 0031341068     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00505-3     Document Type: Article

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