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Volumn 36, Issue 12 SUPPL. B, 1997, Pages 7786-7790
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Nanometer pattern-mask fabricated by conventional photolithography
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Author keywords
A metal insulator tunnel transistor (MITT); Anodic oxidation; Etching selectivity; Integrated circuit (IC); Metal insulator metal (MIM) structure
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Indexed keywords
ANODIC OXIDATION;
ATOMIC FORCE MICROSCOPY;
ETCHING;
FILM GROWTH;
MASKS;
MIM DEVICES;
NANOTECHNOLOGY;
SCANNING ELECTRON MICROSCOPY;
THIN FILMS;
TITANIUM DIOXIDE;
TRANSISTORS;
METAL/INSULATOR TUNNEL TRANSISTORS (MITT);
NANOMETER PATTERN MASKS;
PHOTOLITHOGRAPHY;
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EID: 0031340939
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.36.7786 Document Type: Article |
Times cited : (11)
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References (7)
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