Thin films of granular silicon: Electrical, structural and optical characterization

Solid State Phenomena

Volumn 54, Issue , 1997, Pages 109-118

  Ciofi, C ^a   Diligenti, A ^a   Nannini, A ^a   Pennelli, G ^a   Vannucci, N ^a   Fuso, F ^a   Allegrini, M ^b  

^a UNIVERSITY OF PISA   (Italy)

^b UNIVERSITY OF MESSINA   (Italy)

Author keywords

Granular Silicon; Nanocrystals; Photoluminescence

Indexed keywords

ANNEALING; CRYSTALLINE MATERIALS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC VARIABLES MEASUREMENT; ELECTRON TUNNELING; ION BEAMS; NANOSTRUCTURED MATERIALS; PHOTOLUMINESCENCE; SEMICONDUCTING SILICON; SEMICONDUCTOR DIODES; SPUTTER DEPOSITION; THERMAL EFFECTS;

GRANULAR SILICON; ION BEAM CO SPUTTERING;

THIN FILMS;

EID: 0031340080     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/ssp.54.109     Document Type: Article

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