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Volumn 50, Issue 1-3, 1997, Pages 32-37

Caracterization of AIN buffer layers on (0001)-sapphire substrates

Author keywords

AlN; Buffer layers; Sapphire substrate

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; ELECTRONIC PROPERTIES; METALLORGANIC VAPOR PHASE EPITAXY; SAPPHIRE; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTOR GROWTH; SUBSTRATES;

EID: 0031339842     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(97)00205-5     Document Type: Article
Times cited : (15)

References (11)
  • 3
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    • H. Amano, N. Sawaki, I. Akasaki, Y. Toyoda, T. Sasaki, T. Matsuoka, Appl. Phys. Lett., 48 (1986) 353; T. Sasaki, T. Matsuoka, J. Appl. Phys., 77 (1995) 192.
    • (1995) J. Appl. Phys. , vol.77 , pp. 192
    • Sasaki, T.1    Matsuoka, T.2
  • 4
    • 0026244249 scopus 로고
    • S. Nakamura, Jpn. J. Appl. Phys., 30 (10A) (1991) L1705-L1707; S.D. Hersee, J. Ramer, K. Zheng, C. Kranenberg, K. Malloy, M. Banas, M. Goorsky, J. Electron. Mater., 24 (11) (1995) 1519.
    • (1991) Jpn. J. Appl. Phys. , vol.30 , Issue.10 A
    • Nakamura, S.1
  • 8
    • 0000673317 scopus 로고
    • H. Kiessig, Ann. Phys., 5 (10) (1931) 715, 769.
    • (1931) Ann. Phys. , vol.5 , Issue.10 , pp. 715
    • Kiessig, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.