|
Volumn 50, Issue 1-3, 1997, Pages 32-37
|
Caracterization of AIN buffer layers on (0001)-sapphire substrates
|
Author keywords
AlN; Buffer layers; Sapphire substrate
|
Indexed keywords
ANNEALING;
ATOMIC FORCE MICROSCOPY;
ELECTRONIC PROPERTIES;
METALLORGANIC VAPOR PHASE EPITAXY;
SAPPHIRE;
SEMICONDUCTING ALUMINUM COMPOUNDS;
SEMICONDUCTOR GROWTH;
SUBSTRATES;
X RAY REFLECTOMETRY;
SEMICONDUCTING GALLIUM COMPOUNDS;
|
EID: 0031339842
PISSN: 09215107
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-5107(97)00205-5 Document Type: Article |
Times cited : (15)
|
References (11)
|