-
1
-
-
0002847988
-
Compositional and orientational characterization of polymeric systems with x-ray microscopy
-
Ade H (1997) Compositional and orientational characterization of polymeric systems with x-ray microscopy. TRIP 5(2):58-66
-
(1997)
TRIP
, vol.5
, Issue.2
, pp. 58-66
-
-
Ade, H.1
-
2
-
-
0003626547
-
-
Copies from Center of Solid State Science, Arizona State University, or from Gatan Inc.
-
Ahn CC, Krivanek OL (1983) EELS Atlas (Copies from Center of Solid State Science, Arizona State University, or from Gatan Inc.)
-
(1983)
EELS Atlas
-
-
Ahn, C.C.1
Krivanek, O.L.2
-
3
-
-
23044524126
-
Segregation at adherend interphases in fiber-reinforced epoxies
-
Arayasantiparb D, Siangchaew K, Libera M, McKnight S (1997) Segregation at adherend interphases in fiber-reinforced epoxies. Microsc. Microanal. 3 (Suppl 2):543-544
-
(1997)
Microsc. Microanal.
, vol.3
, Issue.2 SUPPL.
, pp. 543-544
-
-
Arayasantiparb, D.1
Siangchaew, K.2
Libera, M.3
McKnight, S.4
-
4
-
-
0024019441
-
Morphology of ethylene-co-propylene rubber-modified nylon 66 blends
-
Ban LL, Doyle MJ, Disko MM, Smith GR (1988) Morphology of ethylene-co-propylene rubber-modified nylon 66 blends. Polymer Commun 29:163-166
-
(1988)
Polymer Commun
, vol.29
, pp. 163-166
-
-
Ban, L.L.1
Doyle, M.J.2
Disko, M.M.3
Smith, G.R.4
-
5
-
-
0028746265
-
Electron holography of polymer blends
-
Bailey GW, Garrett-Reed AJ (eds). San Francisco: San Francisco Press
-
Blackson J, Zhang X, Joy DC (1994) Electron holography of polymer blends. In: Proceedings of the Fifty-Second Annual Meeting of the Microscopy Society of America, Bailey GW, Garrett-Reed AJ (eds). San Francisco: San Francisco Press, pp 126-127
-
(1994)
Proceedings of the Fifty-Second Annual Meeting of the Microscopy Society of America
, pp. 126-127
-
-
Blackson, J.1
Zhang, X.2
Joy, D.C.3
-
6
-
-
0023980604
-
Electron energy loss spectroscopy: Application to synthetic organic polymers
-
Briber RM, Khoury F (1988) Electron energy loss spectroscopy: application to synthetic organic polymers. J Polymer Sci (B) Polymer Phys 26:621-636
-
(1988)
J Polymer Sci (B) Polymer Phys
, vol.26
, pp. 621-636
-
-
Briber, R.M.1
Khoury, F.2
-
7
-
-
0029379751
-
Correlations between ionization damage and charging effects in transmission electron microscopy
-
Cazaux J (1995) Correlations between ionization damage and charging effects in transmission electron microscopy. Ultramicroscopy 60:411-425
-
(1995)
Ultramicroscopy
, vol.60
, pp. 411-425
-
-
Cazaux, J.1
-
8
-
-
0002944748
-
Imaging properties and applications of slow-scan charge-coupled device cameras suitable for electron microscopy
-
de Ruijter WJ (1995) Imaging properties and applications of slow-scan charge-coupled device cameras suitable for electron microscopy. Micron 26(3):247-275
-
(1995)
Micron
, vol.26
, Issue.3
, pp. 247-275
-
-
De Ruijter, W.J.1
-
9
-
-
0022440598
-
The interphase in epoxy composites
-
Dusek K (ed). New York: Springer-Verlag
-
Drzal LT (1986) The interphase in epoxy composites. In: Advances in Polymer Science, Dusek K (ed). New York: Springer-Verlag, pp 2-32
-
(1986)
Advances in Polymer Science
, pp. 2-32
-
-
Drzal, L.T.1
-
10
-
-
0015639592
-
Electron energy loss studies of polymers during radiation damage
-
Ditchfield RW, Grubb DT, Wheelan J (1973) Electron energy loss studies of polymers during radiation damage. Phil Mag 27:1267-1280
-
(1973)
Phil Mag
, vol.27
, pp. 1267-1280
-
-
Ditchfield, R.W.1
Grubb, D.T.2
Wheelan, J.3
-
11
-
-
0017009440
-
Measurement of inelastic/elastic scattering ratio for fast electrons and its use in the study of radiation damage
-
Egerton RF (1976) Measurement of inelastic/elastic scattering ratio for fast electrons and its use in the study of radiation damage. Phys Stat Soc (a) 37:663-668
-
(1976)
Phys Stat Soc (a)
, vol.37
, pp. 663-668
-
-
Egerton, R.F.1
-
14
-
-
0015143286
-
Rate of damage of polymer crystals in the electron microscope: Dependence on temperature and beam voltage
-
Grubb DT, Groves GW (1971) Rate of damage of polymer crystals in the electron microscope: dependence on temperature and beam voltage. Phil Mag 24:815-828
-
(1971)
Phil Mag
, vol.24
, pp. 815-828
-
-
Grubb, D.T.1
Groves, G.W.2
-
15
-
-
0000730108
-
Phase contrast imaging of styrene-isoprene and styrene-butadiene block copolymers
-
Handlin DL, Thomas EL (1983) Phase contrast imaging of styrene-isoprene and styrene-butadiene block copolymers. Macromolecules 16:1514-1525
-
(1983)
Macromolecules
, vol.16
, pp. 1514-1525
-
-
Handlin, D.L.1
Thomas, E.L.2
-
16
-
-
0002283723
-
Microdomain structure and the interface in block copolymers
-
Goodman I (ed). City: Applied Science Publishers
-
Helfand E, Wasserman ZR (1982) Microdomain structure and the interface in block copolymers. In: Developments in Block Copolymers - I, Goodman I (ed). City: Applied Science Publishers, pp 99-125
-
(1982)
Developments in Block Copolymers - I
, pp. 99-125
-
-
Helfand, E.1
Wasserman, Z.R.2
-
18
-
-
0003598030
-
-
Malabar, FL: R.E. Krieger Publishing
-
Hirsch PB, Howie A, Nicholson RB, Pashley DW, Whelan MJ (1977) Transmission Electron Microscopy of Thin Crystals. Malabar, FL: R.E. Krieger Publishing
-
(1977)
Transmission Electron Microscopy of Thin Crystals
-
-
Hirsch, P.B.1
Howie, A.2
Nicholson, R.B.3
Pashley, D.W.4
Whelan, M.J.5
-
19
-
-
0008595966
-
Radiation damage problems in the electron microscope
-
Howie A (1980) Radiation damage problems in the electron microscope. Rev Phys Appl 15:291-295
-
(1980)
Rev Phys Appl
, vol.15
, pp. 291-295
-
-
Howie, A.1
-
20
-
-
0022131876
-
Electron beam ionization damage processes in p-terphenyl
-
Howie A, Rocca FJ, Valdre U (1985) Electron beam ionization damage processes in p-terphenyl. Phil Mag B 52:751-757
-
(1985)
Phil Mag B
, vol.52
, pp. 751-757
-
-
Howie, A.1
Rocca, F.J.2
Valdre, U.3
-
21
-
-
0039718885
-
Beam damage in organic crystals
-
Brown ML (ed). Bristol, UK: Institute of Physics
-
Howie A, Mohd Muhid MN, Rocca FJ, Valdre U (1987) Beam damage in organic crystals. In: Electron Microscopy and Analysis, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference (EMAG 87), Brown ML (ed). Bristol, UK: Institute of Physics, pp 155-158
-
(1987)
Electron Microscopy and Analysis, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference (EMAG 87)
, pp. 155-158
-
-
Howie, A.1
Mohd Muhid, M.N.2
Rocca, F.J.3
Valdre, U.4
-
22
-
-
0026244994
-
Electron energy-loss spectrum-imaging
-
Hunt JA, Williams DB (1991) Electron energy-loss spectrum-imaging. Ultramicroscopy 38:47-73
-
(1991)
Ultramicroscopy
, vol.38
, pp. 47-73
-
-
Hunt, J.A.1
Williams, D.B.2
-
23
-
-
0028748010
-
Interactive multiple area spectrum integration
-
Bailey GW, Garret-Reed AJ (ed). San Francisco: San Francisco Press
-
Hunt JA, Leapman RD, Williams DB (1994) Interactive multiple area spectrum integration. In: Proceedings of the Fifty-Second Annual Meeting of the Microscopy Society of America, Bailey GW, Garret-Reed AJ (ed). San Francisco: San Francisco Press, pp 942-943
-
(1994)
Proceedings of the Fifty-Second Annual Meeting of the Microscopy Society of America
, pp. 942-943
-
-
Hunt, J.A.1
Leapman, R.D.2
Williams, D.B.3
-
25
-
-
0002251039
-
Specimen damage in the electron microscope
-
Hayat MA (ed). New York: Van Nostrand Reinhold
-
Isaacson MS (1977) Specimen damage in the electron microscope. In: Principles and Techniques of Electron Microscopy, Vol. 7, Hayat MA (ed). New York: Van Nostrand Reinhold, pp 1-78
-
(1977)
Principles and Techniques of Electron Microscopy
, vol.7
, pp. 1-78
-
-
Isaacson, M.S.1
-
26
-
-
0024641551
-
Spectrum-image: The next step in EELS digital acquisition and processing
-
Jeanguillaume C, Colliex C (1988) Spectrum-image: the next step in EELS digital acquisition and processing. Ultramicroscopy 28: 252-257
-
(1988)
Ultramicroscopy
, vol.28
, pp. 252-257
-
-
Jeanguillaume, C.1
Colliex, C.2
-
27
-
-
84970385729
-
The osmium tetroxide procedure for light and electron microscopy of ABS plastics
-
Kato K (1967) The osmium tetroxide procedure for light and electron microscopy of ABS plastics. Polymer Eng Sci 00:38-39
-
(1967)
Polymer Eng Sci
, vol.0
, pp. 38-39
-
-
Kato, K.1
-
28
-
-
0008749128
-
Design and application of a post-column imaging filter
-
Bentley J, Small JA (eds). San Francisco: San Francisco Press
-
Krivanek OL, Grubbens AJ, Dellby N, Meyer CE (1992) Design and application of a post-column imaging filter. In: Proceedings of the 50th Animal Meeting of Electron Microscopy Society of America, Bentley J, Small JA (eds). San Francisco: San Francisco Press, pp 1192-1193
-
(1992)
Proceedings of the 50th Animal Meeting of Electron Microscopy Society of America
, pp. 1192-1193
-
-
Krivanek, O.L.1
Grubbens, A.J.2
Dellby, N.3
Meyer, C.E.4
-
29
-
-
0026499195
-
Quantitative energy-filtered electron microscopy of biological molecules in ice
-
Langmore JP, Smith MF (1992) Quantitative energy-filtered electron microscopy of biological molecules in ice. Ultramicroscopy 46:349-373
-
(1992)
Ultramicroscopy
, vol.46
, pp. 349-373
-
-
Langmore, J.P.1
Smith, M.F.2
-
30
-
-
0015660766
-
The collection of scattered electrons in dark field electron microscopy: I. Elastic scattering
-
Langmore JP, Wall J, Isaacson MS (1973) The collection of scattered electrons in dark field electron microscopy: I. Elastic scattering. Optik 38:335-350
-
(1973)
Optik
, vol.38
, pp. 335-350
-
-
Langmore, J.P.1
Wall, J.2
Isaacson, M.S.3
-
31
-
-
17144418039
-
Zur Streuung mittelschneller Elektronel in kleinste Winkel
-
Lenz (1954) Zur Streuung mittelschneller Elektronel in kleinste Winkel. Z Naturforsch 9A:161-168
-
(1954)
Z Naturforsch
, vol.9 A
, pp. 161-168
-
-
Lenz1
-
32
-
-
0002008184
-
Transmission electron holography of polymer microstructure
-
Tonomura A, Allard L, Pozzi G, Joy D, Ono Y (eds). Amsterdam: North Holland
-
Libera M, Ott J, Wang YC (1995) Transmission electron holography of polymer microstructure. In: Electron Holography, Tonomura A, Allard L, Pozzi G, Joy D, Ono Y (eds). Amsterdam: North Holland, pp 231-238
-
(1995)
Electron Holography
, pp. 231-238
-
-
Libera, M.1
Ott, J.2
Wang, Y.C.3
-
33
-
-
0000250651
-
Experimental high-resolution electron microscopy of polymers
-
Martin DC, Thomas EL (1995) Experimental high-resolution electron microscopy of polymers. Polymer 36:1743-1759
-
(1995)
Polymer
, vol.36
, pp. 1743-1759
-
-
Martin, D.C.1
Thomas, E.L.2
-
34
-
-
84913398277
-
Applications of auger spectroscopy
-
Brundle CR, Baker AD (eds). New York: Academic Press
-
McGuire GE, Holloway PH (1981) Applications of auger spectroscopy. In Materials Analysis in Electron Spectroscopy - Theory, Techniques and Applications, Vol 4, Brundle CR, Baker AD (eds). New York: Academic Press, pp 1-84
-
(1981)
Materials Analysis in Electron Spectroscopy - Theory, Techniques and Applications
, vol.4
, pp. 1-84
-
-
McGuire, G.E.1
Holloway, P.H.2
-
35
-
-
0029121538
-
Delocalization in inelastic scattering
-
Muller, Silcox (1995) Delocalization in inelastic scattering. Ultramicroscopy 59:195-213
-
(1995)
Ultramicroscopy
, vol.59
, pp. 195-213
-
-
Muller, S.1
-
36
-
-
0006285024
-
Parallel electron energy-loss spectroscopy of poly(ether ether ketone)
-
Payne RS, Beamson G (1993) Parallel electron energy-loss spectroscopy of poly(ether ether ketone). Polymer 34(8):1637-1643
-
(1993)
Polymer
, vol.34
, Issue.8
, pp. 1637-1643
-
-
Payne, R.S.1
Beamson, G.2
-
38
-
-
0025050519
-
Contrast in the electron spectroscopic imaging mode of a TEM. II. Z-ratio, structure-sensitive and phase contrast
-
Reimer L, Ross-Messemer (1990) Contrast in the electron spectroscopic imaging mode of a TEM. II. Z-ratio, structure-sensitive and phase contrast. J Microsc 159 Pt 2:143-160
-
(1990)
J Microsc
, vol.159
, Issue.2 PART
, pp. 143-160
-
-
Reimer, L.1
Ross-Messemer2
-
39
-
-
0023869131
-
Operation modes of electron spectroscopic imaging and electron energy-loss spectroscopy in a transmission electron microscope
-
Reimer L, Fromm L, Rennekamp R (1988) Operation modes of electron spectroscopic imaging and electron energy-loss spectroscopy in a transmission electron microscope. Ultramicroscopy 24: 339-354
-
(1988)
Ultramicroscopy
, vol.24
, pp. 339-354
-
-
Reimer, L.1
Fromm, L.2
Rennekamp, R.3
-
40
-
-
0031100276
-
Spectromicroscopy of poly(ethylene terephthalate): Comparison of spectra and radiation damage rates in X-ray absorption and electron energy-loss
-
Rightor EG, Hitchcock AP, Ade H, Leapman RD, Urquhart SG, Smith AP, Mitchell G, Fischer D, Shin HJ, Warwick T (1997) Spectromicroscopy of poly(ethylene terephthalate): comparison of spectra and radiation damage rates in X-ray absorption and electron energy-loss. J Phys Chem B 101:1950-1960
-
(1997)
J Phys Chem B
, vol.101
, pp. 1950-1960
-
-
Rightor, E.G.1
Hitchcock, A.P.2
Ade, H.3
Leapman, R.D.4
Urquhart, S.G.5
Smith, A.P.6
Mitchell, G.7
Fischer, D.8
Shin, H.J.9
Warwick, T.10
-
41
-
-
0001988977
-
Electronic states and triboelectricity
-
Mort J, Pfister G (eds). New York: John Wiley & Sons
-
Ritsko JJ (1982) Electronic states and triboelectricity. In: Electronic Properties of Polymers, Mort J, Pfister G (eds). New York: John Wiley & Sons, pp 13-58
-
(1982)
Electronic Properties of Polymers
, pp. 13-58
-
-
Ritsko, J.J.1
-
42
-
-
0000565340
-
Core excitons and the dielectric response of polystyrene and poly(2-vinylpyridine) from 1 to 400 eV
-
Ritsko JJ, Bigelow RW (1978) Core excitons and the dielectric response of polystyrene and poly(2-vinylpyridine) from 1 to 400 eV. J Chem Phys 69(9):4162-4170
-
(1978)
J Chem Phys
, vol.69
, Issue.9
, pp. 4162-4170
-
-
Ritsko, J.J.1
Bigelow, R.W.2
-
43
-
-
0010367678
-
Television pickup tubes and the problem of vision
-
Rose (1948) Television pickup tubes and the problem of vision. Adv Electronics 1:131-166
-
(1948)
Adv Electronics
, vol.1
, pp. 131-166
-
-
Rose1
-
47
-
-
0030702633
-
Measuring polymer microstructure using spatially-resolved EELS in STEM
-
Morphological Control in Multiphase Polymer Mixtures, Briber RM (ed). City: publisher
-
Siangchaew K, Arayasantiparb D, Libera M (1997) Measuring polymer microstructure using spatially-resolved EELS in STEM. In: Morphological Control in Multiphase Polymer Mixtures, Briber RM (ed). Proc. 1996 MRS Fall Meeting v461 1997, City: publisher, pp 199-203
-
(1997)
Proc. 1996 MRS Fall Meeting v461 1997
, pp. 199-203
-
-
Siangchaew, K.1
Arayasantiparb, D.2
Libera, M.3
-
49
-
-
0028466395
-
Contrast and radiation damage in point-projection electron imaging of purple membrane at 100 V
-
Spence J, Qian W, Zhang X (1994) Contrast and radiation damage in point-projection electron imaging of purple membrane at 100 V. Ultramicroscopy 55:19-23
-
(1994)
Ultramicroscopy
, vol.55
, pp. 19-23
-
-
Spence, J.1
Qian, W.2
Zhang, X.3
-
50
-
-
4243494792
-
Excitation of it electrons in polystyrene and similar polymers by 20-keV electrons
-
Swanson N, Powell CJ (1963) Excitation of it electrons in polystyrene and similar polymers by 20-keV electrons. J Chem Phys 39:630-634
-
(1963)
J Chem Phys
, vol.39
, pp. 630-634
-
-
Swanson, N.1
Powell, C.J.2
-
51
-
-
0001414622
-
Ruthenium tetroxide staining of polymers for electron microscopy
-
Trent JS, Scheinbeim JI, Couchman PR (1983) Ruthenium tetroxide staining of polymers for electron microscopy. Macromolecules 16:589-598
-
(1983)
Macromolecules
, vol.16
, pp. 589-598
-
-
Trent, J.S.1
Scheinbeim, J.I.2
Couchman, P.R.3
-
52
-
-
0031570695
-
Towards subnanometer scale EELS analysis of polymers in the TEM
-
Varlot K, Martin JM, Quet C, Kihn Y (1997a) Towards subnanometer scale EELS analysis of polymers in the TEM. Ultramicroscopy 68:123-133
-
(1997)
Ultramicroscopy
, vol.68
, pp. 123-133
-
-
Varlot, K.1
Martin, J.M.2
Quet, C.3
Kihn, Y.4
-
53
-
-
0031488708
-
Chemical analysis of polymers using transmission electron microscope/electron energy-loss spectroscopy: The example of poly(ethylene terephthalate)
-
Varlot K, Martin JM, Quet C, Kihn Y (1997b) Chemical analysis of polymers using transmission electron microscope/electron energy-loss spectroscopy: the example of poly(ethylene terephthalate). Macromolecules Symp 119:317-324
-
(1997)
Macromolecules Symp
, vol.119
, pp. 317-324
-
-
Varlot, K.1
Martin, J.M.2
Quet, C.3
Kihn, Y.4
-
55
-
-
17144387261
-
Radiation damage in biological electron microscopy
-
ed. New York: Academic Press
-
Zeitler E (1990) Radiation damage in biological electron microscopy. In: Biological Electron Microscopy, (ed.) New York: Academic Press, pp 289-308
-
(1990)
Biological Electron Microscopy
, pp. 289-308
-
-
Zeitler, E.1
|