Measuring polymer microstructure using spatially-resolved EELS in the stem

Materials Research Society Symposium - Proceedings

Volumn 461, Issue , 1997, Pages 199-203

  Siangchaew, K ^a   Arayasantiparb, D ^a   Libera, M ^a  

^a STEVENS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA ACQUISITION; HIGH DENSITY POLYETHYLENES; MICROSTRUCTURE; NYLON POLYMERS; POLYETHYLENES; POLYMER BLENDS; POLYSTYRENES; TRANSMISSION ELECTRON MICROSCOPY;

DATA SETS; HEAVY ELEMENT STAIN; HOMOPOLYMER BLEND; IMAGE CONTRAST; MULTIPHASE POLYMER; SCANNING TRANSMISSION ELECTRON MICROSCOPE; SPECTRAL FINGERPRINTS; SPECTRUM IMAGING TECHNIQUE; STAINING METHOD;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 0030702633     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)