AXAF synchrotron witness mirror calibrations 2-12 keV

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3113, Issue , 1997, Pages 30-39

  Fitch, J J ^a   Blake, R L ^a   Burek, A J ^a   Clark, A M ^a   Graessle, D E ^a   Harris, B ^a   Schwartz, D A ^a   Sweeney, J ^a  

^a SMITHSONIAN ASTROPHYSICAL OBSERVATORY   (United States)

Author keywords

AXAF; Iridium; Optical constants; Synchrotron radiation; X ray reflectivity

Indexed keywords

ASTROPHYSICS; CALIBRATION; DATA ACQUISITION; IRIDIUM; LIGHT REFLECTION; SYNCHROTRON RADIATION; X RAY OPTICS;

OPTICAL CONSTANTS;

MIRRORS;

EID: 0031310695     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.278867     Document Type: Conference Paper

References (8)

1. Monitoring Program for the Coating of the AXAF Flight Optics
2. Correlation between x-ray reflectivity measurements and surface roughness of AXAF coated witness samples
3. Determination of Optical Constants for AXAF Mirrors from 0.05-1.0 kev through reflectance Measurements
4. Los Alamos X-ray characterization facilities for plasma diagnostics
5. Reflectance Calibrations of AXAF witness mirrors using synchrotron radiation, 2-12 keV
6. Optical constants from synchrotron reflectance measurements of AXAF witness mirrors 2-12 keV