Optical constants from synchrotron reflectance measurements of AXAF witness mirrors, 2-12 keV

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3113, Issue , 1997, Pages 52-64

  Graessle, D E ^a   Burek, A J ^a   Fitch, J J ^a   Harris, B ^a   Schwartz, D A ^a   Blake, R L ^a  

^a SMITHSONIAN ASTROPHYSICAL OBSERVATORY   (United States)

Author keywords

AXAF; Iridium; Optical constants; Synchrotron radiation; X ray reflectivity

Indexed keywords

ALGORITHMS; ASTROPHYSICS; GAUSSIAN NOISE (ELECTRONIC); IRIDIUM; LIGHT REFLECTION; SYNCHROTRON RADIATION; X RAY OPTICS;

SYNCHROTRON REFLECTANCE;

MIRRORS;

EID: 0031305012     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.278886     Document Type: Conference Paper

References (9)

1. Optical Constants for thin films of C, diamond, Al, Si, and CVD SiC from 24 Ǎ to 1216 Ǎ
2. AXAF synchrotron witness mirror calibrations. 2-12 keV
3. Molecular contamination study of iridium-coated X-ray mirrors
4. Determination of optical constants for AXAF mirrors from 0.05-1.0 kev through reflectance measurements
5. X-ray interactions: Photoabsorption, scattering, transmission, and reflection at E=50-30,000 eV, Z=1-92
6. Reflectance calibrations of AXAF witness mirrors using synchrotron radiation, 2-12 keV