Determination of optical constants for AXAF mirrors from 0.05-1.0 keV through reflectance measurements

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3113, Issue , 1997, Pages 40-51

  Harris, B ^a   Burek, A J ^a   Fitch, J J ^a   Graessle, D E ^a   Schwartz, D A ^a   Blake, R L ^a   Gullikson, E M ^a  

^a HARVARD SMITHSONIAN CENTER FOR ASTROPHYSICS   (United States)

Author keywords

AXAF; Iridium; Optical constants; Synchrotron radiation; X ray reflectance; X rays

Indexed keywords

ASTROPHYSICS; IRIDIUM; LIGHT REFLECTION; OPTICAL COATINGS; SYNCHROTRON RADIATION; THIN FILMS; X RAY OPTICS;

X RAY REFLECTANCE;

MIRRORS;

EID: 0031310990     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.278876     Document Type: Conference Paper

References (10)

1. Calibration and standards beamline 6.3.2 at the advanced light source
2. Optical constants for thin films of C, diamond, Al, Si, and CVD SiC from 24-1216 angstroms
3. X-ray interactions: Photoabsorption, scattering, transmission, and reflection at E=50-30000 eV, Z=1-92