Growth of ZnS, CdS and multilayer ZnS/CdS thin films by SILAR technique

Applied Surface Science

Volumn 115, Issue 4, 1997, Pages 386-392

  Valkonen, Mika P ^a   Kanniainen, Tapio ^a   Lindroos, Seppo ^a   Leskelä, Markku ^a   Rauhala, Eero ^a  

^a UNIVERSITY OF HELSINKI   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; FILM GROWTH; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING GLASS; SEMICONDUCTING ZINC COMPOUNDS; STOICHIOMETRY; X RAY ANALYSIS; X RAY DIFFRACTION; ZINC SULFIDE;

CADMIUM SULFIDE; ENERGY DISPERSIVE X RAY ANALYSIS;

THIN FILMS;

EID: 0031210185     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(97)00008-1     Document Type: Article

References (23)

1. Y.F. Nicolau, Appl. Surf. Sci. 22/23 (1985) 1061.
2. S. Lindroos, T. Kanniainen and M. Leskelä, Appl. Surf. Sci. 75 (1994) 70.
3. Y.F. Nicolau, M. Dupuy and M. Brunel, J. Electrochem. Soc. 137 (1990) 2915.
4. J.M. Doña and J. Herrero, 12th Eur. Photovoltaic Sol. Energy Conf., Amsterdam, 1994, p. 597.
5. M. Pellegrino, M.L. Addonizio and A. Parretta, 12th Eur. Photovoltaic Sol. Energy Conf., Amsterdam, 1994, p. 645.
6. P. O'Brien and T. Saeed, J. Cryst. Growth 158 (1996) 497.
7. J.M. Doña and J. Herrero, Thin Solid Films 268 (1995) 5.
8. G.K. Padam, G.L. Malhotra and S.U. Rao, J. Appl. Phys. 63 (1988) 770.
9. G.C. Morris and R.J. Vanderveen, Appl. Surf. Sci. 92 (1996) 630.
10. G. Brunthaler, M. Lang, A. Forstner, C. Giftge, D. Schikora, S. Ferreira, H. Sitter and K. Lischka, J. Cryst. Growth 238 (1994) 559.
11. N. Samarath, H. Luo, J.K. Furdyna, R.G. Alonso, Y.R. Lee, A.K. Ramdas, S.B. Qadri and N. Otsuka, Appl. Phys. Lett. 56 (1990) 1163.
12. H. Wang, K.S. Wong, I.K. Sou and G.K.L. Wong, Appl. Phys. Lett. 66 (1995) 3140.
13. J.T. Mullis and T. Tagushi, J. Cryst. Growth 117 (1992) 501.
14. I. Suemune, H. Masato, K. Nakanishi, Y. Kuroda and M. Yamanishi, J. Cryst. Growth 107 (1991) 679.
15. K.A. Dhese, J.E. Nicholls, W.E. Hagston, P.J. Wright, B. Cockayne and J.J. Davies, J. Cryst. Growth 138 (1994) 140.
16. A. Abounadi, A. Rajira, M. Averous and J. Calas, Phys. Status Solidi (b) 189 (1995) 265.
17. K.P. O'Donnel, P.J. Parbrook, B. Henderson, C. Trager-Cowan, X. Chen, F. Yang, M.P. Halsall, P.J. Wright and B. Cockayne, J. Cryst. Growth 101 (1990) 554.
18. A. Rautiainen, Y. Koskinen, J. Skarp and S. Lindfors, Mater. Res. Soc. Symp. Proc. 222 (1991) 263.
19. S. Fujita, Y. Kawakami and S. Fujita, Physica B 191 (1993) 57.
20. C. Trager-Cowan, P.J. Parbrook, B. Henderson and K.P. O'Donnel, Semicond. Sci. Technol. 7 (1992) 536.
21. Y.F. Nicolau and J.C. Menard, J. Cryst. Growth 92 (1988) 128.
22. Powder Diffraction File 1994, PDF-2 Database Sets 1-44, International Centre for Diffraction Data, Dataware Technologies Inc., PA, USA (1994).
23. J. Saarilahti and E. Rauhala, Nucl. Instr. Meth. B 64 (1992) 734.