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Volumn 220, Issue 2-3, 1997, Pages 187-194

Infrared and Raman spectroscopy of particle-beam induced damage of silicon carbide

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; CRYSTAL LATTICES; DIELECTRIC PROPERTIES OF SOLIDS; INFRARED SPECTROSCOPY; INTERFACES (MATERIALS); ION BEAMS; ION BOMBARDMENT; ION IMPLANTATION; LIGHT ABSORPTION; RAMAN SPECTROSCOPY; REFRACTIVE INDEX; SILICON;

EID: 0031272980     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(97)00305-0     Document Type: Article
Times cited : (23)

References (32)
  • 17
    • 0039647875 scopus 로고    scopus 로고
    • W. Theiss, e-mail: theiss@acds10.physik.rwth-aachen.de
    • W. Theiss, e-mail: theiss@acds10.physik.rwth-aachen.de.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.