High-contrast piezoelectric fiber resonance detection for near-field optical microscopy

Review of Scientific Instruments

Volumn 68, Issue 11, 1997, Pages 4120-4123

  Debarre A ^a   Richard, A ^a   Tchenio P ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; LASER BEAMS; NATURAL FREQUENCIES; OPTICAL FIBERS; OSCILLATORS (MECHANICAL); PIEZOELECTRIC DEVICES; RESONANCE; SIGNAL TO NOISE RATIO; VIBRATIONS (MECHANICAL);

FIBER RESONANCE; PIEZOELECTRIC CANTILEVER; PIEZOELECTRIC SHEAR FORCE DETECTION;

OPTICAL MICROSCOPY;

EID: 0031271494     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148355     Document Type: Article

References (17)

1. W. Pohl, W. Denk, and M. Lanz, Appl. Phys. Lett. 44, 651 (1984).
2. E. Betzig, J. K. Trautman, T. D. Harris, J. S. Weiner, and R. L. Kostelak, Science 251, 1468 (1991).
3. D. Courjon and C. Banier, Rep. Prog. Phys. 57, 989 (1994).
4. E. Betzig, P. L. Fin, and J. S. Weiner, Appl. Phys. Lett. 60, 2484 (1992); R. D. Grober, T. D. Harris, J. K. Trautman, and E. Betzig, Rev. Sci. Instrum. 65, 626 (1994), and references therein.
5. E. Betzig, P. L. Fin, and J. S. Weiner, Appl. Phys. Lett. 60, 2484 (1992); R. D. Grober, T. D. Harris, J. K. Trautman, and E. Betzig, Rev. Sci. Instrum. 65, 626 (1994), and references therein.
6. R. Toledo-Crow, P. C. Yang, Y. Chen, and M. Vaez-Iravani, Appl. Phys. Lett. 60, 2957 (1992).
7. On conductive samples scanning tunnel microscope distance control can be used. For example, see U. Dürig, D. W. Pohl, and F. Rohner, Appl. Phys. Lett. 59, 3318 (1986); M. Garcia-Parajo, E. Cambril, and Y. Chen, ibid.65, 1498 (1994).
8. On conductive samples scanning tunnel microscope distance control can be used. For example, see U. Dürig, D. W. Pohl, and F. Rohner, Appl. Phys. Lett. 59, 3318 (1986); M. Garcia-Parajo, E. Cambril, and Y. Chen, ibid.65, 1498 (1994).
9. K. Karrai and R. D. Grober, Appl. Phys. Lett. 66, 1842 (1995).
10. R. S. Decca, H. D. Drew, and K. L. Empson, Rev. Sci. Instrum. 68, 1291 (1997).
11. J. W. P. Hsu, M. Lee, and B. S. Deaver, Rev. Sci. Instrum. 66, 3177 (1995); M. Lee, E. B. McDaniel, and J. W. P. Hsu, ibid. 67, 1468 (1996).
12. J. W. P. Hsu, M. Lee, and B. S. Deaver, Rev. Sci. Instrum. 66, 3177 (1995); M. Lee, E. B. McDaniel, and J. W. P. Hsu, ibid. 67, 1468 (1996).
13. J. Barenz, O. Hollricher, and O. Marti, Rev. Sci. Instrum. 67, 1912 (1996).
14. A. Dräbenstedt, J. Wrachtrup, and C. von Borczyskowski, Appl. Phys. Lett. 68, 3497 (1996).
15. Y. T. Yang, D. Heh, P. K. Wei, W. S. Fann, M. H. Gray, and J. W. P. Hsu, J. Appl. Phys. 81, 1623 (1996).
16. M. E. Taylor, Rev. Sci. Instrum. 64, 154 (1993).
17. Buzzer-type EI-242-B from Euroind.