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Journal of Materials Science Letters

Volumn 16, Issue 19, 1997, Pages 1551-1554

Oxidation process from SnO to SnO2

(9) Choi, W K a Sung, H a Kim, K H a Cho, J S a Choi, S C a Jung, H J a Koh, S K a Lee, C M b Jeong, K b

a Korea Institute of Science and Technology (South Korea)

b Yonsei University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; AUGER ELECTRON SPECTROSCOPY; CRYSTAL ATOMIC STRUCTURE; CRYSTAL ORIENTATION; DEPOSITION; FILM GROWTH; FILM PREPARATION; OXIDATION; PHASE TRANSITIONS; POLYCRYSTALLINE MATERIALS; SEGREGATION (METALLOGRAPHY); X RAY DIFFRACTION ANALYSIS;

GLANCING ANGLE X RAY DIFFRACTION (GXRD); REACTIVE ION ASSISTED DEPOSITION; TIN OXIDE;

TIN COMPOUNDS;

EID: 0031258307 PISSN: 02618028 EISSN: None Source Type: Journal
DOI: 10.1023/A:1018547813759 Document Type: Article

Times cited : (65)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.