Delay Fault Coverage Enhancement Using Variable Observation Times

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 11, Issue 2, 1997, Pages 131-146

  Jone, W B ^a,c,d,e,f   Ho, Y P ^a,g,h   Das, S R ^{b,c,f,i,j,k,l,m,n,o}  

^a NATIONAL CHUNG CHENG UNIVERSITY   (Taiwan)

^b UNIVERSITY OF OTTAWA   (Canada)

^c NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^d CASE WESTERN RESERVE UNIVERSITY   (United States)

^e NEW MEXICO INSTITUTE OF MINING AND TECHNOLOGY   (United States)

^f IEEE   (United States)

^g Tatung Institute of Technology   (Taiwan)

^h NATIONAL NANO DEVICE LABORATORIES   (Taiwan)

ⁱ UNIVERSITY OF CALCUTTA   (India)

^j Stanford University   (United States)

^k UNIVERSITY OF CALCUTTA   (India)

^l Ablex Publishing Corporation   (United States)

^m IEEE Computer Society Press   (United States)

ⁿ Inst Elec Electronics E   (Canada)

^o UNIVERSITY OF CALIFORNIA   (United States)

more..

Author keywords

Delay fault testing; Delay test observation times; Statistical delay fault coverage

Indexed keywords

STATISTICAL TESTS; TESTING; VLSI CIRCUITS;

DELAY FAULT TESTING; DELAY TEST OBSERVATION TIMES; STATISTICAL DELAY FAULT COVERAGE;

DELAY CONTROL SYSTEMS;

EID: 0031251001     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1008266305694     Document Type: Article

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