![]() |
Volumn 44, Issue 9, 1997, Pages 1609-1615
|
Two-point optical resolution with homogeneous, evanescent and self field: Resolution criterion in near field imaging
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ELECTROMAGNETIC FIELDS;
ELECTROMAGNETIC WAVE DIFFRACTION;
IMAGING TECHNIQUES;
MICROSCOPES;
OPTICAL RESOLVING POWER;
QUANTUM OPTICS;
SCANNING NEAR FIELD OPTICAL MICROSCOPY (SNOM);
OPTICAL MICROSCOPY;
|
EID: 0031234150
PISSN: 09500340
EISSN: 13623044
Source Type: Journal
DOI: 10.1080/09500349708230762 Document Type: Article |
Times cited : (17)
|
References (16)
|