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Volumn 180, Issue 1, 1997, Pages 54-60
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First principles calculations of Si(2 1 1) surface reconstructions
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Author keywords
Si surfaces; Total energy calculations
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Indexed keywords
CARRIER CONCENTRATION;
COMPUTATIONAL METHODS;
CRYSTAL ORIENTATION;
INTERFACIAL ENERGY;
SURFACE PHENOMENA;
SURFACE RECONSTRUCTIONS;
SEMICONDUCTING SILICON;
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EID: 0031233603
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(97)00199-1 Document Type: Article |
Times cited : (22)
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References (20)
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