Heteroepitaxy of HgCdTe(112) infrared detector Structures on Si(112) substrates by molecular-beam epitaxy

Journal of Electronic Materials

Volumn 25, Issue 8, 1996, Pages 1341-1346

  De Lyon, T J ^a   Rajavel, R D ^a   Jensen, J E ^a   Wu, O K ^a   Johnson, S M ^b   Cockrum, C A ^b   Venzor, G M ^b  

^a Hughes Aircraft Co   (United States)

^b Santa Barbara Research Center   (United States)

Author keywords

CdTe; CdTe Si; Focal plane arrays (FPAs); Heteroepitaxy; HgCdTe; HgCdTe Si; Hybrid reliability; Infrared detectors; Molecular beam epitaxy (MBE)

Indexed keywords

EID: 0000696384     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02655030     Document Type: Article

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