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Volumn 5, Issue 5, 1997, Pages 439-450

Neural networks for the simulation of photoresist exposure process in integrated circuit fabrication

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATA THEORY; BACKPROPAGATION; COMPUTER SIMULATION; ETCHING; INTEGRATED CIRCUIT MANUFACTURE; LEARNING SYSTEMS; PHOTORESISTS;

EID: 0031219706     PISSN: 09650393     EISSN: None     Source Type: Journal    
DOI: 10.1088/0965-0393/5/5/001     Document Type: Article
Times cited : (6)

References (16)
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    • Understanding lithography technology issues through simulation
    • Neureuther A R 1993 Understanding lithography technology issues through simulation Japan. J. Appl. Phys. 32 5823
    • (1993) Japan. J. Appl. Phys. , vol.32 , pp. 5823
    • Neureuther, A.R.1
  • 3
    • 10644283828 scopus 로고
    • Massively parallel computing in materials modelling
    • Loh E 1993 Massively parallel computing in materials modelling Physica D 66 108
    • (1993) Physica D , vol.66 , pp. 108
    • Loh, E.1
  • 6
    • 0029732180 scopus 로고    scopus 로고
    • Neural networks application for OPC (optical proximity correction) in mask making
    • Jedrasik P 1996 Neural networks application for OPC (optical proximity correction) in mask making Microelectronic Engineering 30 161
    • (1996) Microelectronic Engineering , vol.30 , pp. 161
    • Jedrasik, P.1
  • 7
    • 10644236201 scopus 로고
    • Adaptive neural network algorithms for computing proximity effect corrections
    • Frye R C 1991 Adaptive neural network algorithms for computing proximity effect corrections J. Vac. Sci. Technol. B 9 3054
    • (1991) J. Vac. Sci. Technol. B , vol.9 , pp. 3054
    • Frye, R.C.1
  • 8
    • 0029378440 scopus 로고
    • Simulation of two-dimensional photoresist etching process in integrated circuit fabrication using cellular automata
    • Karafyllidis I and Thanailakis A 1995 Simulation of two-dimensional photoresist etching process in integrated circuit fabrication using cellular automata Model. Simul. Mater. Sci. Eng. 3 629
    • (1995) Model. Simul. Mater. Sci. Eng. , vol.3 , pp. 629
    • Karafyllidis, I.1    Thanailakis, A.2
  • 9
    • 0030086631 scopus 로고    scopus 로고
    • Simulation of the image reversal submicron process in integrated circuit fabrication
    • Karafyllidis I and Thanailakis A 1996 Simulation of the image reversal submicron process in integrated circuit fabrication Semicond. Sci. Technol. 11 214
    • (1996) Semicond. Sci. Technol. , vol.11 , pp. 214
    • Karafyllidis, I.1    Thanailakis, A.2
  • 13
    • 5344278635 scopus 로고
    • Negative-tone deep-ultraviolet resists containing benzylic crosslinkers: Experimental and simulation studies of the crosslinking process
    • Zenk A M, Neureuther A R, Lee S M and Frechet J M J 1994 Negative-tone deep-ultraviolet resists containing benzylic crosslinkers: experimental and simulation studies of the crosslinking process J. Vac. Sci. Technol. B 12 3851
    • (1994) J. Vac. Sci. Technol. B , vol.12 , pp. 3851
    • Zenk, A.M.1    Neureuther, A.R.2    Lee, S.M.3    Frechet, J.M.J.4
  • 14
    • 0024861871 scopus 로고
    • Approximations by superpositions of a sigmoidal function
    • Cybenko C 1994 Approximations by superpositions of a sigmoidal function Math. Contr. Signals SS 2 303
    • (1994) Math. Contr. Signals SS , vol.2 , pp. 303
    • Cybenko, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.