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Volumn 5, Issue 5, 1997, Pages 439-450
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Neural networks for the simulation of photoresist exposure process in integrated circuit fabrication
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Author keywords
[No Author keywords available]
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Indexed keywords
AUTOMATA THEORY;
BACKPROPAGATION;
COMPUTER SIMULATION;
ETCHING;
INTEGRATED CIRCUIT MANUFACTURE;
LEARNING SYSTEMS;
PHOTORESISTS;
PHOTOLITHOGRAPHIC RESIST EXPOSURE PROCESS;
FEEDFORWARD NEURAL NETWORKS;
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EID: 0031219706
PISSN: 09650393
EISSN: None
Source Type: Journal
DOI: 10.1088/0965-0393/5/5/001 Document Type: Article |
Times cited : (6)
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References (16)
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