Identification of a buried single quantum well within surface structured semiconductors using depth resolved x-ray grazing incidence diffraction

Journal of Physics D: Applied Physics

Volumn 30, Issue 16, 1997, Pages

  Darowski, N ^a   Paschke, K ^a   Pietsch, U ^a   Wang, K H ^b   Forchel, A ^b   Baumbach, T ^c   Zeimer, U ^d  

^a UNIVERSITY OF POTSDAM   (Germany)

^b UNIVERSITY OF WÜRZBURG   (Germany)

^c Fraunhofer Inst F Z   (Germany)

^d LEIBNIZ INSTITUT FÜR HÖCHSTFREQUENZTECHNIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; LIGHT SCATTERING; NANOSTRUCTURED MATERIALS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR QUANTUM WIRES; SURFACE STRUCTURE; X RAY CRYSTALLOGRAPHY;

HIGH RESOLUTION X RAY DIFFRACTION (HRXRD); X RAY GRAZING INCIDENCE DIFFRACTION (GID);

SEMICONDUCTOR QUANTUM WELLS;

EID: 0031209705     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/30/16/001     Document Type: Article

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