Simulation and analysis of the I-V characteristics of a Schottky diode containing barrier inhomogeneities

Semiconductor Science and Technology

Volumn 12, Issue 7, 1997, Pages 899-906

  Chand, Subhash ^a,b   Kumar, Jitendra ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

^b NATIONAL INSTITUTE OF TECHNOLOGY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENT MEASUREMENT; ELECTRON MICROSCOPY; VOLTAGE MEASUREMENT;

BALLISTIC ELECTRON EMISSION MICROSCOPY; CAPACITANCE VOLTAGE MEASUREMENTS; CURRENT VOLTAGE MEASUREMENTS; PHOTORESPONSE MEASUREMENT;

SCHOTTKY BARRIER DIODES;

EID: 0031191070     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/12/7/022     Document Type: Article

References (21)

1. Dio M D, Cola A, Lupo M G and Vasanelli L 1995 Solid-State Electron. 38 1923
2. Chand S and Kumar J 1995 Semicond. Sci. Technol. 10 1680
3. Chand S and Kumar J 1996 Appl. Phys. A 63 171
4. Werner J H and Guttler H H 1991 J. Appl. Phys. 69 1522
5. Chand S and Kumar J 1996 J. Appl. Phys. 80 288
6. Chand S and Kumar J 1996 Semicond. Sci. Technol. 11 1203
7. Johnson V A, Smith R N and Yearian H J 1950 J. Appl. Phys. 21 283
8. Sullivan J P, Tung R T, Pinto M R and Graham W R 1991 J. Appl. Phys. 70 7403
9. Tung R T 1991 Appl. Phys. Lett. 58 2821
10. Tung R T 1992 Phys. Rev. B 45 13 509
11. Henisch H K 1984 Semiconductor Contacts (London: Oxford University Press) p 123
12. Ohdomari I and Tu K N 1980 J. Appl. Phys. 51 3735
13. Freeouf J L, Jackson T N, Laux S E and Woodall J M 1982 Appl. Phys. Lett. 40 634
14. Freeouf J L, Jackson T N, Laux S E and Woodall J M 1982 J. Vac. Sci. Technol. 21 570
15. Osvald J 1992 Solid-State Electron. 35 1629
16. Chin V W L, Green M A and Storey J W V 1990 Solid-State Electron. 33 299
17. Song Y P, Meirhaegle R L V, Laflere W H and Cardon F 1986 Solid-State Electron. 29 633
18. Horvath Zs J 1992 Mater. Res. Soc. Symp. Proc. 260 367
19. Palm H, Arbes M and Schulz M 1993 Phys. Rev. Lett. 71 2224
20. Dobrocka E and Osvald J 1994 Appl. Phys. Lett. 65 575
21. Rhoderick E H 1978 Metal - Semiconductor Contacts 2nd edn (Oxford: Clarendon)