Calorimetric determination of NiAl3-growth kinetics in sputter-deposited Ni/Al diffusion couples

Journal of Alloys and Compounds

Volumn 257, Issue 1-2, 1997, Pages 211-214

  Michaelsen, C ^a   Barmak, K ^b  

^a INSTITUTE OF MATERIALS RESEARCH   (Germany)

^b Lehigh University   (United States)

Author keywords

Diffusion; Growth kinetics; Ni Al multilayers

Indexed keywords

ACTIVATION ENERGY; DIFFERENTIAL SCANNING CALORIMETRY; DIFFUSION IN SOLIDS; GROWTH KINETICS; INTERMETALLICS; METALLIC FILMS; METALLIC SUPERLATTICES; SPUTTER DEPOSITION; X RAY DIFFRACTION ANALYSIS;

NICKEL TRIALUMINIDE;

NICKEL ALLOYS;

EID: 0031176722     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-8388(97)00014-5     Document Type: Article

References (24)

1. M. Dahms, Advanced Performance Materials 1 (1994) 157.
2. M. Dahms, T.J. Jewett, C. Michaelsen, Z. Metallkde 88 (1997) 125.
3. E.G. Colgan, Mater. Sci. Rep. 5 (1990) 1.
4. F.M. d'Heurle, J. Mater. Res. 3 (1988) 167.
5. K. Barmak, C. Michaelsen, J. Rickman, M. Dahms, Mat. Res. Soc. Symp. Proc. 398 (1996) 51.
6. R. Bormann, Mat. Res. Soc. Symp. Proc. 343 (1994) 169.
7. C. Michaelsen, G. Lucadamo, K. Barmak, J. Appl. Phys. 80 (1996) 6689.
8. E. Ma, C.V. Thompson, L.A. Clevenger, J. Appl. Phys. 69 (1991) 2211.
9. K. Barmak, C. Michaelsen, G. Lucadamo, J. Mater. Res. 12 (1997) 133.
10. X.-A. Zhao, H.-Y. Yang, E. Ma, M.-A. Nicolet, J. Appl. Phys. 62 (1987) 1821.
11. E. Ma, M.-A. Nicolet, M. Nathan, J. Appl. Phys. 65 (1989) 2703.
12. A.S. Edelstein, R.K. Everett, G.Y. Richardson, S.B. Qadri, E.I. Altman, J.C. Foley, J.H. Perepezko, J. Appl. Phys. 76 (1994) 7850.
13. A.S. Edelstein, R.K. Everett, G.R. Richardson, S.B. Qadri, J.C. Foley, J.H. Perepezko, Mater. Sci. Eng. A195 (1995) 13.
14. L.S. Castleman, L.L. Seigle, Trans. AIME 212 (1958) 589.
15. M.M.P. Janssen, G.D. Rieck, Trans. AIME 239 (1967) 1372.
16. S.B. Yung, Y. Minamino, T. Yamane, S. Saji, J. Mater. Sci. Lett. 12 (1993) 1684.
17. H. Mehrer, Mater. Trans. JIM 37 (1996) 1259.
18. Joyce C. Liu, J.W. Mayer, J.C. Barbour, J. Appl. Phys. 64 (1988) 651.
19. Joyce C. Liu, J.W. Mayer, J.C. Barbour, J. Appl. Phys. 64 (1988) 656.
20. Neglecting volume changes, the thickness of the trialuminide can be simply found by dividing the periodicity by two, since the molar ratio of Ni and Al in our multilayers is that of the trialuminide and there are two reacting interfaces per period.
21. E.J. Cotts, W.J. Meng, W.L. Johnson, Phys. Rev. Lett. 57 (1986) 2295.
22. R.J. Highmore, J.E. Evetts, A.L. Greer, R.E. Somekh, Appl. Phys. Lett. 50 (1987) 566.
23. A.W. Coats, J.P. Redfern, Nature 201 (1964) 68.
24. A. Ortega, L.A. Perez-Maqueda, J.M. Criado, Thermochim. Acta 282/283 (1996) 29.