Raman microprobe analysis of patterned Tl-2212 thin films

IEEE Transactions on Applied Superconductivity

Volumn 7, Issue 2 PART 2, 1997, Pages 2126-2129

  Myers, Kirsten E ^a   Walls, Dennis J ^a   Wilker, Charles ^a   Pang, Philip S W ^a   Carter, Charles F ^a  

^a DUPONT COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HELIUM NEON LASERS; OXIDE SUPERCONDUCTORS; OXYGEN; RAMAN SPECTROSCOPY; SUPERCONDUCTING TRANSITION TEMPERATURE; THALLIUM; THIN FILMS; YTTRIUM COMPOUNDS;

ION MILLING; OXYGEN LOSS; RAMAN MICROPROBES;

SUPERCONDUCTING FILMS;

EID: 0031170178     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.621012     Document Type: Article

References (13)

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