Critical current density and resistivity measurements for long patterned lines in Tl2Ba2CaCu2O8 thin films

Journal of Applied Physics

Volumn 74, Issue 2, 1993, Pages 1426-1430

  Holstein, W L ^a   Wilker, C ^a   Laubacher, D B ^a   Face, D W ^a   Pang, P ^a   Warrington, M S ^a   Carter, C F ^a   Parisi, L A ^a  

^a DUPONT COMPANY   (United States)

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Indexed keywords

EID: 0347338366     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.354902     Document Type: Article

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