Characterization of sputtered films of Tl2Ba2CaCu2O8 using Raman scattering and x-ray diffraction

Physica C: Superconductivity and its applications

Volumn 182, Issue 4-6, 1991, Pages 231-240

  Chrzanowski, J ^a   Irwin, J C ^a   Heinrich, B ^a   Curzon, A E ^a   Fortier, N ^b   Cragg, A ^b  

^a SIMON FRASER UNIVERSITY   (Canada)

^b CTF Systems Inc   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; RAMAN SCATTERING; SPUTTERING; THALLIUM COMPOUNDS; X-RAYS--DIFFRACTION;

OXIDE SUPERCONDUCTORS; THALLIUM BARIUM CALCIUM COPPER OXIDES;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0026255115     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4534(91)90517-3     Document Type: Article

References (36)

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