Silicon drift detectors with on-chip electronics for x-ray spectroscopy

Journal of X-Ray Science and Technology

Volumn 7, Issue 2, 1997, Pages 117-129

  Fiorini, C ^a   Longoni, A ^a   Hartmann, R ^b   Lechner, P ^c   Struder L ^b  

^a POLITECNICO DI MILANO   (Italy)

^b MPI HALBLEITERLABOR   (Germany)

^c KETEK GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; CAPACITANCE; JUNCTION GATE FIELD EFFECT TRANSISTORS; SILICON WAFERS; X RAY SPECTROSCOPY;

SILICON DRIFT DETECTORS (SDD);

SILICON SENSORS;

EID: 0031169685     PISSN: 08953996     EISSN: None     Source Type: Journal    
DOI: 10.1006/jxra.1997.0256     Document Type: Article

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