How to describe AFM constant force surfaces in repulsive mode?

Surface Science

Volumn 349, Issue 2, 1996, Pages 196-206

  Blagov, E V ^a   Klimchitskaya, G L ^b   Lobashov, A A ^c   Mostepanenko, V M ^d,e  

^a Res and Innovation Enterprise Modus   (Russian Federation)

^b SAINT PETERSBURG MINING UNIVERSITY   (Russian Federation)

^c D I MENDELEYEV INSTITUTE FOR METROLOGY   (Russian Federation)

^d ST PETERSBURG STATE INSTITUTE OF TECHNOLOGY TECHNICAL UNIVERSITY   (Russian Federation)

^e UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

Atom solid interactions, scattering, diffraction; Scanning tunneling microscopy; Surface defects; Surface structure, morphology, roughness and topography

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALCULATIONS; CRYSTAL ATOMIC STRUCTURE; DIFFRACTION; MORPHOLOGY; POINT DEFECTS; SCANNING TUNNELING MICROSCOPY; SCATTERING;

ATOM SOLID INTERACTIONS; CONSTANT FORCE SURFACES; SURFACE DEFECTS; TOPOGRAPHY;

SURFACE STRUCTURE;

EID: 0030129074     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)01035-7     Document Type: Article

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