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Journal of Applied Physics

Volumn 75, Issue 1, 1994, Pages 393-403

Relation between electrical properties and microstructure of YBa 2Cu3O7-x thin films deposited by single-target off-axis sputtering

(6) Westerheim, A C a Anderson, Alfredo C a Oates, D E a Basu, S N b Bhatt, D b Cima, M J a

a MASSACHUSETTS INSTITUTE OF TECHNOLOGY (United States)

b BOSTON UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000766657 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.357012 Document Type: Article

Times cited : (39)

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