High power failure of superconducting microwave filters: investigation by means of thermal imaging

Applied Physics Letters

Volumn 69, Issue 4, 1996, Pages 571-573

  Hampel, G ^a   Kolodner, P ^a   Gammel, P L ^a   Polakos, P A ^a   de Obaldia, E ^a   Mankiewich, P M ^a   Anderson, A ^a   Slattery, R ^a   Zhang, D ^a   Liang, G C ^a   Shih, C F ^a  

^a NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; CURRENT DENSITY; ELECTRIC CURRENT DISTRIBUTION; ELECTRIC FAULT CURRENTS; ELECTRIC RESISTANCE; HEAT CONDUCTION; HIGH TEMPERATURE SUPERCONDUCTORS; INFRARED IMAGING; LANTHANUM COMPOUNDS; MICROWAVE DEVICES; SCANNING ELECTRON MICROSCOPY; YTTRIUM COMPOUNDS;

CHEBYSHEV FILTERS; FLUOROPHONE; HOT SPOTS; LANTHANUM ALUMINATE; PASSBAND FILTERS; SUPERCONDUCTING MICROWAVE FILTERS; YTTRIUM BARIUM CUPRATE;

ELECTRIC FILTERS;

EID: 0030192962     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117790     Document Type: Article

References (4)