Chemical imaging of surfaces with laser desorption mass spectrometry

TrAC - Trends in Analytical Chemistry

Volumn 16, Issue 5, 1997, Pages 242-252

  Savina, Michael R ^a   Lykke, Keith R ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; DESORPTION; IONIZATION; LASERS; MASS SPECTROMETRY; MOLECULES; SURFACES;

ION YIELD; LASER DESORPTION MASS SPECTROMETRY; MASS SPECTROMETRIC IMAGING; TIME OF FLIGHT MASS ANALYZER;

IMAGING TECHNIQUES;

IMAGING; LASER; MASS SPECTROMETRY; PRIORITY JOURNAL; REVIEW; SURFACE PROPERTY;

EID: 0031149149     PISSN: 01659936     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0165-9936(97)00028-9     Document Type: Article

References (31)

1. A. Benninghoven, Surf. Sci. 299/300 (1994) 246.
2. A. Benninghoven, B. Hagenhoff, E. Niehuis, E. Anal. Chem. 65 (1993) 630A.
3. N. Winograd, Anal. Chem. 65 (1993) 622A.
4. J.M. Chabala, K.K. Soni, J. Li, K.L. Gavrilov, R. Levi-Setti, Int. J. Mass Spectrom. Ion Processes 143 (1995) 191.
5. E. Denoyer, R. Van Grieken, F. Adams, D.F.S. Natusch, Anal. Chem. 54 (1982) 26A.
6. D.M. Hercules, R.J. Day, K. Balasanmugam, T.A. Dang, C.P. Li, Anal. Chem. 54 (1982) 280A.
7. R. Zenobi, Int. J. Mass Spectrom. Ion Processes 145 (1995) 51.
8. L. Van Vaeck, H. Struyf, W. Van Roy, F. Adams, Mass Spectrom. Rev. 13 (1994) 189.
9. Z.A. Wilk, D.M. Hercules, Anal. Chem. 59 (1987) 1819.
10. A.I. Gusev, A. Proctor, Y.I. Rabinovich, D.M. Hercules, Anal. Chem. 67 (1995) 1805.
11. A.I. Gusev, O.J. Vasseur, A. Proctor, A.G. Sharkey, D.M. Hercules, Anal. Chem. 67 (1995) 4565.
12. D.S. McKay, E.K. Gibson Jr., K.L. Thomas-Keptra, H Vali, C.S. Romanek, S.J. Clemett, X.D.F. Chillier, C.R. Maechling, R.N. Zare, Science 273 (1996) 5277.
13. S. Nettescheim, R. Zenobi, Chem. Phys. Lett. 255 (1996) 39.
14. C.R. Maechling, S.J. Clemett, F. Engelke, R.N. Zare, J. Chem. Phys. 104 (1996) 8768.
15. P. Wurz, K.R. Lykke, Chem. Phys. 176 (1993) 185.
16. A.A. Deckert, S.M. George, Surf. Sci. Lett. 182 (1987) 215.
17. G.K. Nicolussi, M.J. Pellin, K.R. Lykke, J.L. Trevor, D.E. Mencer, A.M. Davis, Surf. Interface Anal. 24 (1996) 363.
18. M.J. Pellin, C.E. Young, W.F. Calaway, J.E. Whitten, D.M. Gruen, J.D. Blum, I.D. Hutcheon, G.J. Wasserburg, Philos. Trans. R. Soc. London, Ser. A 33 (1990) 133.
19. L.V. Keldysh, Sov. Phys. JETP 20 (1965) 1307.
20. S. Augst, D.D. Meyerhofer, D. Strickland, S.L. Chin, J. Opt. Soc. Am. B 8 (1991) 858.
21. M. Terhorst, R. Möllers, E. Niehuis, A. Benninghoven, Surf. Interface Anal. 18 (1992) 824.
22. M. Terhorst, R. Möllers, E. Niehuis, A. Benninghoven, Org. Mass Spectrom. 27 (1992) 1393.
23. C.L. Brummel, K.F. Willey, J.C. Wickerman, N. Winograd, Int. J. Mass Spectrom. Ion Processes 143 (1994) 257.
24. M.S. de Vries, D.J. Elloway, H.R. Wendt, H.E. Hunziker, Rev. Sci. Instrum. 63 (1992) 3321.
25. L.J. Kovalenko, C.R. Maechling, S.J. Clemett, J.-M. Philippoz, R.N. Zare, C.M.O.D. Alexander, Anal. Chem. 64 (1992) 682.
26. R.W. Odom and B. Schueler, in: D.M. Lubman (Ed.), Lasers and Mass Spectrometry, Oxford University Press, Oxford, 1990, pp. 103-137.
27. K.R. Lykke, P. Wurz, D.H. Parker, M.J. Pellin, Appl. Opt. 32 (1993) 857.
28. W.C. Wiley, I.H. McLaren, Rev. Sci. Instrum. 26 (1955) 1150.
29. A.G. Marshall and F.R. Verdun, Fourier Transforms in NMR, Optical and Mass Spectrometry, Elsevier, New York, 1990.
30. B. Asamoto, FT-ICR/MS: Analytical Applications of Fourier Transform Ion Cyclotron Resonance Mass Spectrometry, VCH, New York, 1991.
31. J.M. Behm, J.C. Hemminger, K.R. Lykke, Anal. Chem. 68 (1996) 713.