Effect of carrier diffusion in oxidized vertical-cavity surface-emitting lasers determined from lateral spontaneous emission

Applied Physics Letters

Volumn 70, Issue 20, 1997, Pages 2652-2654

  Shin, J H ^a   Shin, H E ^a   Lee, Y H ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; COMPUTATIONAL METHODS; CURRENT DENSITY; DIFFUSION IN SOLIDS; LIGHT EMISSION;

NONRADIATIVE RECOMBINATION; SPONTANEOUS EMISSION; VERTICAL CAVITY SURFACE EMITTING LASERS;

SEMICONDUCTOR LASERS;

EID: 0031143510     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118986     Document Type: Article

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