Stacking faults in pseudomorphic ZnSe-GaAs and lattice-matched ZnSe-In0.04Ga0.96As layers

Philosophical Magazine Letters

Volumn 75, Issue 4, 1997, Pages 219-226

  Bonard, Jean Marc ^a   Ganière, Jean Daniel ^a   Heun, Stefan ^b,c   Paggel, Jens J ^b,c,d   Rubini, Silvia ^b,c   Sorba, Lucia ^b,c,e   Franciosi, Alfonso ^b,c,f  

^a EPFL   (Switzerland)

^b LABORATORIO TASC   (Italy)

^c University of Minnesota ^*  (United States)

^d PHILIPPS UNIVERSITY MARBURG   (Germany)

^e CNR   (Italy)

^f UNIVERSITY OF TRIESTE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL LATTICES; CRYSTAL ORIENTATION; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR GROWTH; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY;

FRANK STACKING FAULTS; SHOCKLEY STACKING FAULTS;

HETEROJUNCTIONS;

EID: 0031125343     PISSN: 09500839     EISSN: 13623036     Source Type: Journal    
DOI: 10.1080/095008397179642     Document Type: Article

References (12)

1. Bonanni, A., Vanzetti, L., Sorba, L., Franciosi, A., Lomascolo, M., Prete, P., and Cingolani, R., 1995, Appl. Phys. Lett., 66, 1092.
2. Edington, J.W., 1975, Practical Electron Microscopy in Materials Science, Vol. 3 (London: Macmillan).
3. Guha, S., DePuydt, J.M., Qiu, J., Höfler, G.E., Haase, M.A., Wu, B.J., and Cheng, H., 1993, Appl. Phys. Lett., 63, 3023.
4. Heun, s., Paggel, J.J., Rubini, S., Sorba, L., Franciosi, A., Bonard, J.-M., and Ganière, J.-D., 1997a, Appl. Phys. Lett., 70, 237.
5. Heun, S., Paggel, J.J., Rubini, S., Sorba, L., Franciosi, A., Bonard, J.-M., and Ganière, J.-D., 1997b, Appl. Phys. Lett., to be published.
6. Hull, D., and Bacon, D.J., 1984, Introduction to dislocations (Oxford: Pergamon).
7. Kuo, L.H., Salamanca-Riba, L., Wu, B.J., Höfler, G.E., DePuydt, J.M., and Cheng, h., 1995, Appl. Phys. Lett., 67, 3298.
8. Petruzello, J., Greenberg, B., Cammack, D., and Dalby, R., 1988, Appl. Phys. Lett., 63, 2299.
9. Petruzello, J., Haberern, K.W., Herko, S.P., Marshall, T., Gaines, J.M., Guha, S., U’Ren, G.D., and Haugen, G.M., 1996, J. Cryst. Growth, 159, 573.
10. SchAublin, R., and Stadelmann, P.A., 1993, Mater. Sci. Engng, A, 164, 373.
11. Stadelmann, P.A., 1987, Ultramicroscopy, 21, 131.
12. Tanimura, J., Wada, O., Ogama, T., Éndoh, Y., and Imaizumi, M., 1995, J. Appl. Phys., 77, 6223.