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Thin Solid Films

Volumn 297, Issue 1-2, 1997, Pages 167-170

Time-resolved photoluminescence characterization of nm-sized silicon crystallites in SiO2

(4) Linnros, J a Galeckas, A a Lalic, N a Grivickas, V a

a ROYAL INSTITUTE OF TECHNOLOGY (Sweden)

Author keywords

Nanocrystallites; Photoluminescence; Silicon; Silicon dioxide

Indexed keywords

ANNEALING; ATOMS; CHARACTERIZATION; EXCITONS; ION IMPLANTATION; NANOSTRUCTURED MATERIALS; NUCLEATION; PASSIVATION; PHOTOLUMINESCENCE; SILICA; THIN FILMS;

CARRIER DIFFUSION; CARRIER TRAPPING; SILICON DIOXIDE FILM; TIME RESOLVED PHOTOLUMINESCENCE;

SEMICONDUCTING SILICON;

EID: 0031123966 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(96)09359-5 Document Type: Article

Times cited : (46)

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