|
Volumn 124, Issue 1, 1997, Pages 69-75
|
Optimizing high efficient plasma immersion ion implantation hydrogenation for poly-Si thin film transistors
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CARRIER CONCENTRATION;
CRYSTAL DEFECTS;
HYDROGENATION;
ION IMPLANTATION;
PASSIVATION;
PLASMA SOURCES;
POLYCRYSTALLINE MATERIALS;
SEMICONDUCTING SILICON;
INDUCTIVELY COUPLED PLASMA SOURCES;
PLASMA IMMERSION ION IMPLANTATION;
THIN FILM TRANSISTORS;
|
EID: 0031121152
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(97)00078-5 Document Type: Article |
Times cited : (9)
|
References (15)
|