메뉴 건너뛰기




Volumn 124, Issue 1, 1997, Pages 69-75

Optimizing high efficient plasma immersion ion implantation hydrogenation for poly-Si thin film transistors

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CRYSTAL DEFECTS; HYDROGENATION; ION IMPLANTATION; PASSIVATION; PLASMA SOURCES; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING SILICON;

EID: 0031121152     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00078-5     Document Type: Article
Times cited : (9)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.