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Volumn 388, Issue 3, 1997, Pages 323-329
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Analysis of TSC spectra measured on silicon pad detectors after exposure to fast neutrons
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC CURRENTS;
ELECTRON ENERGY LEVELS;
HEATING;
IRRADIATION;
NEUTRON IRRADIATION;
NEUTRONS;
RADIATION DAMAGE;
SEMICONDUCTOR JUNCTIONS;
SILICON;
TEMPERATURE;
FREE CARRIER;
SILICON DETECTORS;
THERMALLY STIMULATED CURRENT;
PARTICLE DETECTORS;
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EID: 0031120187
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(96)01264-8 Document Type: Article |
Times cited : (4)
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References (20)
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