Characterization of organic thin films for OLEDs using spectroscopic ellipsometry

Journal of Electronic Materials

Volumn 26, Issue 4, 1997, Pages 366-371

  Celii, Francis G ^a   Harton, Tracy B ^a   Phillips, O Faye ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

Organic films; Organic light emitting diodes (OLEDs); Spectroscopic ellipsometry

Indexed keywords

ELLIPSOMETRY; LIGHT EMITTING DIODES; OPTICAL VARIABLES MEASUREMENT; REFRACTIVE INDEX; THIN FILMS;

ORGANIC LIGHT EMITTING DIODES (OLED); ORGANIC THIN FILMS;

ORGANIC COATINGS;

EID: 0031119505     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-997-0103-y     Document Type: Article

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