Capacitors with very low loss: Cryogenic vacuum-gap capacitors

IEEE Transactions on Instrumentation and Measurement

Volumn 45, Issue 5, 1996, Pages 841-846

  Zimmerman, Neil M ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; DIELECTRIC FILMS; ELECTRIC RESISTANCE; ELECTROMETERS; ELECTRON TUNNELING; PERMITTIVITY MEASUREMENT; VACUUM APPLICATIONS;

CRYOGENIC VACUUM GAP CAPACITORS; ELECTRODE SEPARATION; LOWER BOUND; PARALLEL RESISTANCE; SINGLE ELECTRON ELECTROMETERS;

CAPACITORS;

EID: 0030270303     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.536699     Document Type: Article

References (10)

1. E. So and J. Q. Shields, IEEE Trans. Instrum. Meas., vol. IM-28, p. 279, 1979.
2. J. Q. Shields, IEEE Tram. Instrum. Meas., vol. IM-27, p. 464, 1978.
3. M. C. Foote and A. C. Andersen, Rev. Sci. Instrum., vol. 58, p. 130, 1987.
4. E. R. Williams, R. N. Ghosh, and J. M. Martinis, J. Res. NIST, vol. 97, p. 299, 1992.
5. J. M. Martinis, M. Nahum, and H. D. Jensen, Phys. Rev. Lett., vol. 72, p. 904, 1994;
6. M. W. Keller, J. M. Martinis, N. M. Zimmerman, and A. H. Steinbach, Appl. Phys. Lett., to be published.
7. A. F. Clark, N. M. Zimmerman, E. R. Williams, A. Amar, D. Song, F. C. Wellstood, C. J. Lobb, and R. J. Soulen, Jr., Appl. Phys. Lett., vol. 66, p. 2588, 1995.
8. R. N. Ghosh, A. F. Clark, B. A. Sanborn, and E. R. Williams, Coulomb and Interferene Effects in Small Electronic Structures. Gif-sur-Yvette, France: Frontier, 1995, p. 173.
9. B. P. Kibble and G. H. Rayner, Coaxial AC Bridges. Bristol, U.K.: Adam Hilger, 1984.
10. G. Zimmerli, T. M. Eiles, R. L. Kautz, and J. M. Martinis, Appl. Phys. Lett., vol. 61, p. 237, 1992.