Recent results and future challenges for the NIST charged-capacitor experiment

IEEE Transactions on Instrumentation and Measurement

Volumn 46, Issue 2, 1997, Pages 294-298

  Zimmerman, Neil M ^a   Cobb, Jonathan L ^a   Clark, Alan F ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; CAPACITORS; CRYOGENICS; ELECTRIC CHARGE; ELECTRIC IMPEDANCE; ELECTRON TUNNELING; STANDARDS;

CRYOGENIC STANDARD CAPACITORS; SINGLE ELECTRON TUNNELING (SET);

TRANSISTORS;

EID: 0031119210     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.571835     Document Type: Article

References (8)

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7. G. Zimmerli, T. M. Eiles, R. L. Kautz, and J. M. Martinis, Appl. Phys. Lett., vol. 61, p. 237, 1992.
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