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Volumn 388, Issue 3, 1997, Pages 283-288
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Issues for deep level models of bulk damage to silicon detectors
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRONS;
IRRADIATION;
MATHEMATICAL MODELS;
RADIATION DAMAGE;
SILICON;
DEEP LEVEL MODELS;
SILICON DETECTORS;
RADIATION DETECTORS;
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EID: 0031116898
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(96)01256-9 Document Type: Article |
Times cited : (3)
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References (16)
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