Vacancy structures on the GaN(0001) surface

Journal of Materials Research

Volumn 12, Issue 3, 1997, Pages 646-650

  Packard, William E ^a   Dow, John D ^a   Doverspike, Kathleen ^b,d   Kaplan, Ray ^b   Nicolaides, Ruth ^c  

^a ARIZONA STATE UNIVERSITY   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

^c Institute for Postdoctoral Studies   (Virgin Islands (U.S.))

^d Arkansas Power Electronics International Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; HEATING; LOW ENERGY ELECTRON DIFFRACTION; METALLORGANIC CHEMICAL VAPOR DEPOSITION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING FILMS;

DEFECT STRUCTURE; OVAL DEFECT; ROW DEFECT; STRIATIONS; TERRACES; VACANCY STRUCTURE;

SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 0031102540     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1997.0098     Document Type: Article

References (14)

1. K. Doverspike, L.B. Rowland, D.K. Gaskill, and J. A. Freitas, Jr., J. Electron. Mater. 24, 269 (1995).
2. M. A. Khan, J. N. Kuznia, D. T. Olson, and R. Kaplan, J. Appl. Phys. 73, 3108 (1993).
3. J. Neugebauer, J. E. Northrup, and C. G. Van de Walle, Bull. Am. Phys. Soc. 40, 127 (1995).
4. W. E. Packard, J. D. Dow, R. Nicolaides, K. Doverspike, and R. Kaplan, Superlatt. Microstruct. 20, 145 (1996).
5. H. Feil, H.J.W. Zandvliet, M-H. Tsai, J. D. Dow, and I. S. T. Tsong, Phys. Rev. Lett. 69, 3076 (1992).
6. Note that in the absence of a step, with its associated strain energy, the model narrow striations and row defects are degenerate.
7. D.W. Jenkins and J. D. Dow, Phys. Rev. B 39, 3317 (1989).
8. D. W. Jenkins, J. D. Dow, and M-H. Tsai, J. Appl. Phys. 72, 4130 (1992).
9. D. W. Jenkins, J. D. Dow, and C. S. Lent, unpublished.
10. J. D. Dow and R. E. Allen, Appl. Phys. Lett. 41, 672 (1982).
11. I. Akasaki, H. Amano, M. Kito, and K. Hiramoto, J. Lumin. 48, 666 (1990).
12. S. Y. Ren and J. D. Dow, Appl. Phys. Lett. 69, 251 (1996); J. Electron. Mater. (in press).
13. S. Y. Ren and J. D. Dow, Appl. Phys. Lett. 69, 251 (1996); J. Electron. Mater. (in press).
14. Y. Liang, W. E. Packard, J. D. Dow, H. Ho, and G. J. Lapeyre, Phys. Rev. B 48, 11942 (1993).