Hunting for the active sites of surface-enhanced Raman scattering: A new strategy based on single silver particles

Journal of Physical Chemistry B

Volumn 101, Issue 4, 1997, Pages 632-638

  Tong, Xiao ^a,b   Qi, Ye ^a   Li, Sun ^a  

^a University of Minnesota   (United States)

^b UNIVERSITY OF ROCHESTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL MODIFICATION; ELECTROCHEMISTRY; ELEMENTARY PARTICLES; ENERGY GAP; LITHOGRAPHY; NANOSTRUCTURED MATERIALS; RAMAN SCATTERING; SCANNING TUNNELING MICROSCOPY;

SCANNING PROBE MICROSCOPY; SURFACE ENHANCED RAMAN SCATTERING (SERS);

SILVER;

EID: 0030735305     PISSN: 10895647     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (72)

1. Jeanmaire, D. L.; Van Duyne, R. P. J. Electroanal. Chem. 1977, 84, 1-20.
2. Albrecht, M. G.; Creighton, J. A. J. Am. Chem. Soc. 1977, 99, 5215-5217.
3. Van Duyne, R. P. In Chemical and Biochemical Applications of Lasers; C. B. Moore, Ed.; Academic Press: New York, 1979; p 101
4. Surface Enhanced Roman Scattering; R. K. Chang, T. E. Furtak, Eds.; Plenum Press: New York, 1982.
5. Otto, A. In Light Scattering in Solids; M. Cardona, G. Guntherodt, Eds.; Springer-Verlag: Heidelberg, 1984; p 289.
6. Moskovits, M. Rev. Mod. Phys. 1985, 57, 783.
7. Schatz, G. C. Acc. Chem. Res. 1984, 17, 370-376.
8. Kerker, M. Acc. Chem. Res. 1984, 17, 271-277.
9. Ueba, H. Surf. Sci. 1983, 131, 347-366.
10. Otto, A. J. Raman Spectrosc. 1991, 22, 743-752.
11. Campion, A.; Ivanecky, J. E., III; Child, C. M.; Foster, M. J. Am. Chem. Soc. 1995, 117, 11807-11808.
12. Campion, A. J. Electron Spectrosc. Relat. Phenom. 1983, 29, 397-400.
13. Here, the surface morphology refers to the size, shape, and spatial distribution of metal particles that are either supported on a substrate, such as Ag islands on a glass slide, or merged with a substrate, such as protrusions on an electrochemically roughened electrode surface. A related term, namely, "surface roughness", has a more narrow meaning: it only defines an average particle size and does not necessarily include a connotation of spatial distribution.
14. Van Duyne, R. P.; Hulteen, J. C; Treichel, D. A. J. Chem. Phys. 1993, 99, 2101-2115.
15. Schueler, P. A.; Ives, J. T.; DeLaCroix, F.; Lacy, W. B.; Becker, P. A.; Li, J.; Caldwell, K. D.; Drake, B.; Harris, J. M. Anal. Chem. 1993, 65, 3177-3186.
16. Roark, S. E.; Rowlen, K. L. Anal. Chem. 1994, 66, 261-270.
17. Otsuka, I.; Iwasaki, T. J. Vac. Sci. Technol. A 1990, 8, 530-533.
18. Sun, L. Ph.D. Thesis, Northwestern University, Evanston, IL, 1990.
19. Furtak, T. E. J. Electroanal. Chem. 1983, 150, 375-388.
20. Pockrand, I.; Otto, A. Solid State Commun. 1981, 38, 1159-1163.
21. Buncick, M. C.; Warmack, R. J.; Ferrell, T. L. J. Opt. Soc. Am. B 1987, 4, 927-933.
22. Moody, R. L.; Vo-Dinh, T.; Fletcher, W. H. Appl. Spectrosc. 1987, 41, 966-970.
23. Grabar, K. C.; Freeman, R. G.; Hommer, M. B.; Natan, M. J. Anal. Chem. 1995, 67, 735-743.
24. Freeman, R. G.; Grabar, K. C.; Allison, K. J.; Bright, R. M.; Davis, J. A.; Guthrie, A. P.; Hommer, M. B.; Jackson, M. A.; Smith, P. C.; Walter, D. G.; Natan, M. J. Science 1995, 267, 1629-1632.
25. Grabar, K. C.; Smith, P. C.; Musick, M. D.; Davis, J. A.; Walter, D. G.; Jackson, M. A.; Guthrie, A. P.; Natan, M. J. J. Am. Chem. Soc. 1996, 118, 1148-1153.
26. Chumanov, G.; Sokolov, K.; Cotton, T. M. J. Phys. Chem. 1996, 100, 5166-5188.
27. Liao, P. F.; Bergman, J. G.; Chemla, D. S.; Wokaun, A.; Melngailis, J.; Hawryluk, A. M.; Economou, N. P. Chem. Phys. Lett. 1981, 82, 355.
28. Bergman, J. G.; Chemla, D. S.; Liao, P. F.; Glass, A. M.; Pinczuk, A.; Hart, R. M.; Olson, D. H. Opt. Lett. 1981, 6, 33-35.
29. Martin, C. R. Science 1994, 266, 1961-1965.
30. Treichel, D. A. Ph.D. Thesis, Northwestern University, Evanston, IL, 1991.
31. Van Duyne, R. P.; Haller, K. L.; Altkorn, R. I. Chem. Phys. Lett. 1986, 126, 190.
32. Haller, K. L. Ph.D. Thesis, Northwestern University, Evanston, IL, 1988.
33. SERS from colloidal Ag particles has been observed under a spectroscopic microscope. However, the detected signal might result from a cluster of particles since higher resolution images of the observed spots were not reported. See, for example, (a) Emory, S. R.; Nie, S., Pittsburgh Conference, 1996 Meeting Abstract, and (b) Vlckova, B.; Gu, X. J.; Tsai, D. P.; Moskovits, M. J. Phys. Chem. 1996, 100, 3169-3174.
34. SERS from colloidal Ag particles has been observed under a spectroscopic microscope. However, the detected signal might result from a cluster of particles since higher resolution images of the observed spots were not reported. See, for example, (a) Emory, S. R.; Nie, S., Pittsburgh Conference, 1996 Meeting Abstract, and (b) Vlckova, B.; Gu, X. J.; Tsai, D. P.; Moskovits, M. J. Phys. Chem. 1996, 100, 3169-3174.
35. Wardell, J. L. In The Chemistry of the Thiol Group; S. Patai, Ed.; Wiley: New York, 1974; p 186.
36. Bain, C. D.; Troughton, E. B.; Tao, Y.-T.; Evall, J.; Whitesides, G. M.; Nuzzo, R. G. J. Am. Chem. Soc. 1989, 111, 321-335.
37. Tsen, M.; Sun, L. Anal. Chim. Acta 1995, 307, 333-340.
38. Sonnenfeld, R.; Schneir, J.; Hansma, P. K. In Modern Aspects of Electrochemistry; R. E. White, J. O'M. Bockris. B. E. Conway, Eds.; Plenum: New York, 1990.
39. Ross, C. B.; Sun, L.; Crooks, R. M. Langmuir 1993, 9, 632-636.
40. Schoer, J. K.; Ross, C. B.; Crooks, R. M.; Corbitt, T. S.; Hampden-Smith, M. J. Langmuir 1994, 10, 615-618.
41. Schoer, J. K.; Zamborini, F. P.; Crooks, R. M. J. Phys. Chem. 1996, 100, 11086-11091.
42. Hsu, T. Ultramicroscopv 1983, 11, 167.
43. Schott, J. H.; White, H. S. Langmuir 1992, 8, 1955-1960.
44. Johnson, D. C.; LaCourse, W. R. Anal. Chem. 1990, 62, 589A-596A.
45. The Ag particles shown in Figures 4 and 5 were deposited at 500 and 470 mV, respectively. These values are higher than the theoretical threshold of 425 mV. We think that the difference is caused by liquid junction potential and other factors associated with a non-ideal reference electrode.
46. Butt, H.-J.; Berharz, B. Langmuir 1995, 11, 4735-4741.
47. Keller, D. Surf. Sci. 1991, 253, 353.
48. Albrecht, T. R.; Akamine, S.; Carver, T. E.; Quate, C. F. J. Vac. Sci. Technol. A 1990, 8, 3386-3396.
49. Sondag-Huethorst, J. A. M.; Fokkink, L. G. J. Langmuir 1995, 11, 4823-4831.
50. Sun, L.; Crooks, R. M. Langmuir 1993, 9, 1951-1954.
51. Li, W.; Virtanen, J. A.; Penner, R. M. Langmuir 1995, 11, 4361-4365.
52. Li, W.; Virtanen, J. A.; Penner, R. M. J. Phys. Chem. 1994, 98, 11751.
53. Chan, K. C.; Kim, T.; Schoer, J. K.; Crooks, R. M. J. Am. Chem. Soc. 1995, 117, 5875-5876.
54. Berggren, K. K.; Bard, A.; Wilbur, J. L.; Gillaspy, J. D.; Helg, A. G.; McClelland, J. J.; Rolston, S. L.; Phillips, W. D.; Prentiss, M.; Whitesides, G. M. Science 1995, 269, 1255-1257.
55. Jackman, R. J.; Wilbur, J. L.; Whitesides, G. M. Science 1995, 269, 664-666.
56. Chou, S. Y.; Krauss, P. R.; Renstrom, P. J. Science 1996, 272, 85-87.
57. Masuda, H.; Fukuda, K. Science 1995, 268, 1466-1468.
58. L, but not on the area of illumination.
59. -1 as reported in Trulson, M. O.; Mathies, R. A. J. Chem. Phys. 1986, 84, 2068-2074.
60. 2.
61. 2 for t-4MM.
62. We obtained this value by ignoring the local surface roughness and assuming a closely-packed SAM of (√3 × √3)R30 lattice on an Ag(111) surface. The (√3 × √3)R30 lattice distance can be calculated from the nearest neighbor distance of an Ag fee crystal (2.89 Å).
63. The laser spot size was measured following the method in ref 32. The measurement uncertainty is primarily determined by the resolution of the one-dimensional micrometer (0.1 μm) used in the measuring apparatus.
64. NOISE. The measured spectrum baseline noise is about 1 count per second per mW of incident power.
65. Baranovic, G.; Meic, Z.; Gusten, H.; Mink, J.; Keresztury, G. J. Phys. Chem. 1990, 94, 2833-2843.
66. 2 = 4 for spherical particles.
67. Zeman, E. J.; Schatz, G. C. J. Phys. Chem. 1987, 91, 634-643.
68. Blatchford, C. G.; Campbell, J. R.; Creighton, J. A. Surf. Sci. 1982, 120, 435-455.
69. Freeman, R. G.; Hommer, M. B.; Grabar, K. C.; Jackson, M. A.; Natan, M. J. J. Phys. Chem. 1996, 100, 718-724.
70. Gersten, J. I.; Nitzan, A. Surf. Sci. 1985, 158, 165-189.
71. Laor, U.; Schatz, G. C. Chem. Phys. Lett. 1981, 82, 566-570.
72. Wokaun, A.; Gordon, J. P.; Liao, P. F. Phys. Rev. Lett. 1982, 48, 957-960.